參數(shù)資料
型號： MC9S12H256VPVR2
廠商： MOTOROLA INC
元件分類： 微控制器/微處理器
英文描述： 16-BIT, FLASH, 25 MHz, MICROCONTROLLER, PQFP112
封裝： LQFP-112
文件頁數(shù)： 117/131頁
文件大?。?/td> 2133K
代理商： MC9S12H256VPVR2
MC9S12H256 Device User Guide — V01.16
86
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
5. Those pins are internally clamped to VSSPLL and VDDPLL.
6. This pin is clamped low to VSSPLL, but not clamped high. This pin must be tied low in applications.
Table A-2 ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series Resistance
R1
1500
Storage Capacitance
C
100
pF
Number of Pulse per pin
positive
negative
–
3
Machine
Series Resistance
R1
0
Storage Capacitance
C
200
pF
Number of Pulse per pin
positive
negative
–
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table A-3 ESD and Latch-Up Protection Characteristics
Num C
Rating
Symbol
Min
Max
Unit
1
C Human Body Model (HBM)
VHBM
2000
–
V
2
C Machine Model (MM)
VMM
200
–
V
3
C Charge Device Model (CDM)
VCDM
500
–
V
4C
Latch-up Current at TA = 125°C
positive
negative
ILAT
+100
–100
–mA
5C
Latch-up Current at TA = 27°C
positive
negative
ILAT
+200
–200
–mA
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