Program and erase operations do not req" />
參數(shù)資料
型號(hào): MC9S08QA4CPAE
廠商: Freescale Semiconductor
文件頁(yè)數(shù): 10/32頁(yè)
文件大小: 0K
描述: IC MCU 8BIT 4K FLASH 8-DIP
產(chǎn)品培訓(xùn)模塊: 8-Bit Microcontroller Overview
標(biāo)準(zhǔn)包裝: 50
系列: S08
核心處理器: S08
芯體尺寸: 8-位
速度: 20MHz
外圍設(shè)備: LVD,POR,PWM,WDT
輸入/輸出數(shù): 4
程序存儲(chǔ)器容量: 4KB(4K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 256 x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 4x10b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 8-DIP(0.300",7.62mm)
包裝: 管件
產(chǎn)品目錄頁(yè)面: 728 (CN2011-ZH PDF)
MC9S08QA4 Series MCU Data Sheet, Rev. 3
Electrical Characteristics
Freescale Semiconductor
18
Program and erase operations do not require any special power sources other than the normal VDD supply. For more detailed
information about program/erase operations, see MC9S08QA4 Series Reference Manual.
Table 14. Flash Characteristics
Characteristic
Symbol
Min
Typical
Max
Unit
Supply voltage for program/erase
–40
°C to 85°CV
prog/erase
1.8
3.6
V
Supply voltage for read operation
VRead
1.8
3.6
V
Internal FCLK frequency1
1 The frequency of this clock is controlled by a software setting.
fFCLK
150
200
kHz
Internal FCLK period (1/FCLK)
tFcyc
5
6.67
μs
Byte program time (random location)2
tprog
9tFcyc
Byte program time (burst mode)2
tBurst
4tFcyc
Page erase time2
2 These values are hardware state machine controlled. User code does not need to count cycles. This information supplied for
calculating approximate time to program and erase.
tPage
4000
tFcyc
Mass erase time2
tMass
20,000
tFcyc
Program/erase endurance3
TL to TH = –40°C to + 85°C
T = 25
°C
3 Typical endurance for flash was evaluated for this product family on the 9S12Dx64. For additional information on how
Motorola defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical Endurance for Nonvolatile Memory.
10,000
100,000
cycles
Data retention4
4 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25
°C using the Arrhenius equation. For additional information on how Freescale defines typical data retention, please refer
to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.
tD_ret
15
100
years
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