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參數(shù)資料
| 型號： | MC9S08FL16CBM |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PDIP32 |
| 封裝： | ROHS COMPLIANT, PLASTIC, SDIP-32 |
| 文件頁數(shù)： | 20/34頁 |
| 文件大?。?/td> | 464K |
| 代理商： | MC9S08FL16CBM |
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Ordering Information
MC9S08FL16 Series Data Sheet, Rev. 3
Freescale Semiconductor
27
5.12
EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
5.12.1
Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (the North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
6
Ordering Information
This section contains ordering information for MC9S08FL16 series devices. See below for an example of
the device numbering system.
5 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25
C using the Arrhenius equation. For additional information on how Freescale defines typical data retention,
please refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
Table 15. Radiated Emissions, Electric Field
Parameter
Symbol
Conditions
Frequency
fOSC/fBUS
Level1
(Max)
1 Data based on qualification test results.
Unit
Radiated emissions,
electric field
VRE_TEM
VDD = 5.0 V
TA = 25
C
package type
32-pin LQFP
0.15 – 50 MHz
4 MHz crystal
19 MHz bus
9
dB
V
50 – 150 MHz
5
150 – 500 MHz
2
500 – 1000 MHz
1
IEC Level
N
—
SAE Level
1
—
Table 16. Device Numbering System
Device Number1
Memory
Available Packages2
FLASH
RAM
MC9S08FL16
16 KB
1024
32 SDIP
32 LQFP
MC9S08FL8
8 KB
768
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MC9S08FL16CLC | 功能描述:8位微控制器 -MCU S08 16K FLASH FL16 RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時鐘頻率:50 MHz 程序存儲器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| MC9S08FL8 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:8-Bit S08 Central Processor Unit (CPU) |
| MC9S08FL8CBM | 功能描述:8位微控制器 -MCU S08 8K FLASH FL8 RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時鐘頻率:50 MHz 程序存儲器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| MC9S08FL8CLC | 功能描述:8位微控制器 -MCU S08 8K FLASH FL8 RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時鐘頻率:50 MHz 程序存儲器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| MC9S08GB32 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Microcontrollers |
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