參數(shù)資料
型號： MC7809CD2T
廠商： ON SEMICONDUCTOR
元件分類： 基準電壓源/電流源
英文描述： THREE-TERMINAL POSITIVE FIXED VOLTAGE REGULATORS
中文描述： 9 V FIXED POSITIVE REGULATOR, PSSO2
封裝： D2PAK-3
文件頁數(shù)： 10/16頁
文件大小： 278K
代理商： MC7809CD2T
MC7800, MC7800A, LM340, LM340A Series
10
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS (continued)
(Vin = 23 V, IO = 1.0 A, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7815AC/LM340AT–15
Characteristic
Symbol
Min
Typ
Max
Unit
Ripple Rejection
18.5 Vdc
≤
Vin
≤
28.5 Vdc, f = 120 Hz, IO = 500 mA
Dropout Voltage (IO = 1.0 A, TJ = 25
°
C)
Output Noise Voltage (TA = 25
°
C)
10 Hz
≤
f
≤
100 kHz
RR
60
80
–
dB
VI – VO
Vn
–
2.0
–
Vdc
–
10
–
μ
V/VO
Output Resistance f = 1.0 kHz
rO
ISC
–
1.2
–
m
Short Circuit Current Limit (TA = 25
°
C)
Vin = 35 Vdc
Peak Output Current (TJ = 25
°
C)
Average Temperature Coefficient of Output Voltage
–
0.2
–
A
Imax
TCVO
–
2.2
–
A
–
–1.0
–
mV/
°
C
ELECTRICAL CHARACTERISTICS
(Vin = 27 V, IO = 500 mA, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7818C
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage (TJ = 25
°
C)
Output Voltage (5.0 mA
≤
IO
≤
1.0 A, PD
≤
15 W)
21 Vdc
≤
Vin
≤
33 Vdc
Line Regulation, (Note 2)
21 Vdc
≤
Vin
≤
33 Vdc
24 Vdc
≤
Vin
≤
30 Vdc
Load Regulation, (Note 2)
5.0 mA
≤
IO
≤
1.5 A
Quiescent Current
VO
VO
17.3
18
18.7
Vdc
17.1
18
18.9
Vdc
Regline
mV
–
–
9.5
3.2
50
25
Regload
–
2.0
55
mV
IB
IB
–
3.5
6.5
mA
Quiescent Current Change
21 Vdc
≤
Vin
≤
33 Vdc
5.0 mA
≤
IO
≤
1.0 A
Ripple Rejection
22 Vdc
≤
Vin
≤
33 Vdc, f = 120 Hz
Dropout Voltage (IO = 1.0 A, TJ = 25
°
C)
Output Noise Voltage (TA = 25
°
C)
10 Hz
≤
f
≤
100 kHz
mA
–
–
–
–
1.0
0.5
RR
53
57
–
dB
ViI – VO
Vn
–
2.0
–
Vdc
–
10
–
μ
V/VO
Output Resistance f = 1.0 kHz
rO
ISC
–
1.3
–
m
Short Circuit Current Limit (TA = 25
°
C)
Vin = 35 Vdc
Peak Output Current (TJ = 25
°
C)
Average Temperature Coefficient of Output Voltage
–
0.2
–
A
Imax
TCVO
–
2.2
–
A
–
–1.5
–
mV/
°
C
NOTES:
1.Tlow = –40
°
C for MC78XXAC, C Thigh = +125
°
C for MC78XXAC, C
2.Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
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