MC7800, MC7800A, LM340, LM340A Series
11
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS
(Vin = 27 V, IO = 1.0 A, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7818AC
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage (TJ = 25
°
C)
Output Voltage (5.0 mA
≤
IO
≤
1.0 A, PD
≤
15 W)
21 Vdc
≤
Vin
≤
33 Vdc
Line Regulation (Note 2)
21 Vdc
≤
Vin
≤
33 Vdc, IO = 500 mA
24 Vdc
≤
Vin
≤
30 Vdc, IO = 1.0 A
24 Vdc
≤
Vin
≤
30 Vdc, IO = 1.0 A, TJ = 25
°
C
20.6 Vdc
≤
Vin
≤
33 Vdc, IO = 1.0 A, TJ = 25
°
C
Load Regulation (Note 2)
5.0 mA
≤
IO
≤
1.5 A, TJ = 25
°
C
5.0 mA
≤
IO
≤
1.0 A
250 mA
≤
IO
≤
750 mA
Quiescent Current
VO
VO
17.64
18
18.36
Vdc
17.3
18
18.7
Vdc
Regline
mV
–
–
–
–
9.5
3.2
3.2
8.0
22
25
10.5
22
Regload
mV
–
–
–
2.0
1.8
1.5
25
25
15
IB
IB
–
3.5
6.0
mA
Quiescent Current Change
21 Vdc
≤
Vin
≤
33 Vdc, IO = 500 mA
21.5 Vdc
≤
Vin
≤
30 Vdc, TJ = 25
°
C
5.0 mA
≤
IO
≤
1.0 A
Ripple Rejection
22 Vdc
≤
Vin
≤
32 Vdc, f = 120 Hz, IO = 500 mA
Dropout Voltage (IO = 1.0 A, TJ = 25
°
C)
Output Noise Voltage (TA = 25
°
C)
10 Hz
≤
f
≤
100 kHz
mA
–
–
–
–
–
–
0.8
0.8
0.5
RR
53
57
–
dB
VI – VO
Vn
–
2.0
–
Vdc
–
10
–
μ
V/VO
Output Resistance f = 1.0 kHz
rO
ISC
–
1.3
–
m
Short Circuit Current Limit (TA = 25
°
C)
Vin = 35 Vdc
Peak Output Current (TJ = 25
°
C)
Average Temperature Coefficient of Output Voltage
–
0.2
–
A
Imax
TCVO
–
2.2
–
A
–
–1.5
–
mV/
°
C
ELECTRICAL CHARACTERISTICS
(Vin = 33 V, IO = 500 mA, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7824C
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage (TJ = 25
°
C)
Output Voltage (5.0 mA
≤
IO
≤
1.0 A, PD
≤
15 W)
27 Vdc
≤
Vin
≤
38 Vdc
Line Regulation, (Note 2)
27 Vdc
≤
Vin
≤
38 Vdc
30 Vdc
≤
Vin
≤
36 Vdc
Load Regulation, (Note 2)
5.0 mA
≤
IO
≤
1.5 A
Quiescent Current
VO
VO
23
24
25
Vdc
22.8
24
25.2
Vdc
Regline
mV
–
–
2.7
2.7
60
48
Regload
–
4.4
65
mV
IB
IB
–
3.6
6.5
mA
Quiescent Current Change
27 Vdc
≤
Vin
≤
38 Vdc
5.0 mA
≤
IO
≤
1.0 A
mA
–
–
–
–
1.0
0.5
NOTES:
1.Tlow = –40
°
C for MC78XXAC, C Thigh = +125
°
C for MC78XXAC, C
2.Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.