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參數(shù)資料
型號: MC74VHCT50ADR2
廠商: ON Semiconductor
文件頁數(shù): 2/6頁
文件大?。?/td> 0K
描述: IC BUFF/LVL SHFTR N-INV 14SOIC
產品變化通告: LTB Notification 03/Jan/2008
標準包裝: 2,500
系列: 74VHCT
邏輯類型: 緩沖器/線路驅動器,非反相
元件數(shù): 6
每個元件的位元數(shù): 1
輸出電流高,低: 8mA,8mA
電源電壓: 2 V ~ 5.5 V
工作溫度: -55°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 14-SOIC(0.154",3.90mm 寬)
供應商設備封裝: 14-SOICN
包裝: 帶卷 (TR)
其它名稱: MC74VHCT50ADR2OS
MC74VHCT50A
http://onsemi.com
2
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
*0.5 to )7.0
V
VIN
DC Input Voltage
*0.5 v VI v )7.0
V
VOUT
DC Output Voltage
Output in HIGH or LOW State
*0.5 v VO v )7.0
V
IIK
DC Input Diode Current
*20
mA
IOK
DC Output Diode Current
$20
mA
IO
DC Output Source/Sink Current
$25
mA
ICC
DC Supply Current per Supply Pin
$50
mA
IGND
DC Ground Current per Ground Pin
$50
mA
TSTG
Storage Temperature Range
*65 to )150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
_C
TJ
Junction Temperature under Bias
)150
_C
qJA
Thermal Resistance
(Note 1)
SOIC
TSSOP
125
170
_C/W
PD
Power Dissipation in Still Air
SOIC
TSSOP
500
450
mW
VESD
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
> 2000
> 200
2000
V
ILatchUp
LatchUp Performance
Above VCC and Below GND at 85_C (Note 5)
$300
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow.
2. Tested to EIA/JESD22A114A.
3. Tested to EIA/JESD22A115A.
4. Tested to JESD22C101A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Characteristics
Symbol
Min
Max
Unit
DC Supply Voltage
VCC
2.0
5.5
V
DC Input Voltage
VIN
0.0
5.5
V
DC Output Voltage
VCC = 0
High or Low State
VOUT
0.0
5.5
VCC
V
Operating Temperature Range
TA
55
+125
°C
Input Rise and Fall Time
VCC = 3.3 V ± 0.3 V
VCC = 5.0 V ± 0.5 V
tr , tf
0
100
20
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
3.0V
GND
50%
50% VCC
A
Y
tPHL
tPLH
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 1. Switching Waveforms
Figure 2. Test Circuit
VOH
VOL
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