參數(shù)資料
型號(hào): MC74LVX573DT
廠商: ON Semiconductor
文件頁(yè)數(shù): 2/7頁(yè)
文件大?。?/td> 0K
描述: IC LATCH OCTAL D 3ST 20-TSSOP
產(chǎn)品變化通告: Product Obsolescence 24/Jan/2011
標(biāo)準(zhǔn)包裝: 75
系列: 74LVX
邏輯類(lèi)型: D 型透明鎖存器
電路: 8:8
輸出類(lèi)型: 三態(tài)
電源電壓: 2 V ~ 3.6 V
獨(dú)立電路: 1
延遲時(shí)間 - 傳輸: 6.4ns
輸出電流高,低: 4mA,4mA
工作溫度: -40°C ~ 85°C
安裝類(lèi)型: 表面貼裝
封裝/外殼: 20-TSSOP(0.173",4.40mm 寬)
供應(yīng)商設(shè)備封裝: 20-TSSOP
包裝: 管件
MC74LVX573
http://onsemi.com
2
Figure 2. Logic Diagram
O0
D0
O1
D1
O2
D2
O3
D3
O4
D4
O5
D5
O6
D6
O7
D7
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
LE
OE
2
3
4
5
6
7
8
9
19
18
17
16
15
14
13
12
11
1
Table 1. PIN NAMES
Pins
Function
OE
LE
D0D7
O0O7
Output Enable Input
Latch Enable Input
Data Inputs
3State Latch Outputs
INPUTS
OUTPUTS
OE
LE
Dn
On
OPERATING MODE
L
H
L
H
L
Transparent (Latch
Disabled); Read Latch
L
h
l
H
L
Latched (Latch Enabled)
Read Latch
L
X
NC
Hold; Read Latch
H
L
X
Z
Hold; Disabled Outputs
H
L
Z
Transparent (Latch
Disabled); Disabled Outputs
H
L
h
l
Z
Latched (Latch Enabled);
Disabled Outputs
H = High Voltage Level; h = High Voltage Level One Setup Time
Prior to the Latch Enable HightoLow Transition; L = Low
Voltage Level; l = Low Voltage Level One Setup Time Prior to the
Latch Enable HightoLow Transition; NC = No Change, State
Prior to the Latch Enable HightoLow Transition; X = High or
Low Voltage Level or Transitions are Acceptable; Z = High
Impedance State; For ICC Reasons DO NOT FLOAT Inputs.
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
–0.5 to +7.0
V
Vin
DC Input Voltage
–0.5 to +7.0
V
Vout
DC Output Voltage
–0.5 to VCC +0.5
V
IIK
Input Diode Current
20
mA
IOK
Output Diode Current
±20
mA
Iout
DC Output Current, per Pin
±25
mA
ICC
DC Supply Current, VCC and GND Pins
±75
mA
PD
Power Dissipation
180
mW
Tstg
Storage Temperature
–65 to +150
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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