參數(shù)資料
型號: MC74ACT241
廠商: ON SEMICONDUCTOR
英文描述: OCTAL BUFFER/LINE DRIVER WITH 3-STATE OUTPUTS
中文描述: 八路緩沖器/線路驅動器,具有三態(tài)輸出
文件頁數(shù): 4/6頁
文件大?。?/td> 165K
代理商: MC74ACT241
MC74AC241 MC74ACT241
5-4
FACT DATA
AC CHARACTERISTICS
(For Figures and Waveforms — See Section 3)
Symbol
Parameter
(V)
74AC
74AC
Unit
No.
VCC*
TA = +25
°
C
CL = 50 pF
TA = –40
°
C
to +85
°
C
CL = 50 pF
Fig.
Min
Typ
Max
Min
Max
tPLH
Propagation Delay
Data to Output
3.3
5.0
1.5
1.5
6.0
5.0
9.0
7.0
1.5
1.0
10.0
7.5
ns
3-5
tPHL
Propagation Delay
Data to Output
3.3
5.0
1.5
1.5
6.0
4.5
9.0
7.0
1.0
1.0
10.5
7.5
ns
3-5
tPZH
Output Enable Time
3.3
5.0
1.5
1.5
6.5
5.5
12.5
9.0
1.0
1.0
13.0
9.5
ns
3-7
tPZL
Output Enable Time
3.3
5.0
1.5
1.5
7.0
5.5
12.0
9.0
1.5
1.0
13.0
9.5
ns
3-8
tPHZ
Output Disable Time
3.3
5.0
2.0
1.5
8.0
6.5
12.0
10.0
2.0
1.0
12.5
10.5
ns
3-7
tPLZ
Output Disable Time
3.3
5.0
1.5
1.5
7.0
6.0
12.5
10.0
1.0
1.0
13.5
10.5
ns
3-8
* Voltage Range 3.3 V is 3.3 V
±
0.3 V.
Voltage Range 5.0 V is 5.0 V
±
0.5 V.
DC CHARACTERISTICS
Symbol
Parameter
(V)
74ACT
74ACT
Unit
Conditions
VCC
TA = +25
°
C
TA =
–40
°
C to +85
°
C
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
V
VOUT = 0.1 V
or VCC – 0.1 V
VIL
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
V
VOUT = 0.1 V
or VCC – 0.1 V
VOH
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
V
IOUT = –50
μ
A
*VIN = VIL or VIH
IOH
4.5
5.5
3.86
4.86
3.76
4.76
V
–24 mA
–24 mA
VOL
Maximum Low Level
Output Voltage
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
V
IOUT = 50
μ
A
*VIN = VIL or VIH
IOL
4.5
5.5
0.36
0.36
0.44
0.44
V
24 mA
24 mA
IIN
Maximum Input
Leakage Current
5.5
±
0.1
±
1.0
μ
A
VI = VCC, GND
ICCT
Additional Max. ICC/Input
5.5
0.6
1.5
mA
VI = VCC – 2.1 V
IOZ
Maximum
Current
VI (OE) = VIL, VIH
VI = VCC, GND
VO = VCC, GND
VOLD = 1.65 V Max
3-State
5.5
±
0.5
±
5.0
μ
A
IOLD
Minimum Dynamic
Output Current
5.5
75
mA
IOHD
5.5
–75
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
8.0
80
μ
A
VIN = VCC or GND
* All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
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