參數(shù)資料
型號(hào): MC68EC030FE40C
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, 40 MHz, MICROPROCESSOR, CQFP132
封裝: LEAD FREE, CERAMIC, QFP-132
文件頁數(shù): 14/44頁
文件大?。?/td> 499K
代理商: MC68EC030FE40C
MOTOROLA
MC68EC030 TECHNICAL DATA
2 1
The total thermal resistance of a package (
θJA) can be separated into two components, θJC and θCA,
representing the barrier to heat flow from the semiconductor junction to the package (case) surface (
θJC)
and from the case to the outside ambient air (
θCA). These terms are related by the equation:
θJA=θJC + θCA
(4)
θJC is device related and cannot be influenced by the user. However, θCA is user dependent and can
be minimized by such thermal management techniques as heat sinks, ambient air cooling, and thermal
convection. Thus, good thermal management on the part of the user can significantly reduce
θCA so that
θJA approximately equals; θJC. Substitution of θJC for θJA in equation (1) results in a lower
semiconductor junction temperature.
Values for thermal resistance presented in this document, unless estimated, were derived using the
procedure described in Motorola Reliability Report 7843, “Thermal Resistance Measurement Method for
MC68XX Microcomponent Devices,” and are provided for design purposes only. Thermal measurements
are complex and dependent on procedure and setup. User derived values for thermal resistance may
differ.
AC ELECTRICAL SPECIFICATION DEFINITIONS
The AC specifications presented consist of output delays, input setup and hold times, and signal skew
times. All signals are specified relative to an appropriate edge of the clock and possibly to one or more
other signals.
The measurement of the AC specifications is defined by the waveforms shown in Figure 9. To test the
parameters guaranteed by Motorola, inputs must be driven to the voltage levels specified in Figure 9.
Outputs are specified with minimum and/or maximum limits, as appropriate, and are measured as shown in
Figure 9. Inputs are specified with minimum setup and hold times, and are measured as shown. Finally,
the measurement for signal-to-signal specifications is also shown.
Note that the testing levels used to verify conformance to the AC specifications does not affect the
guaranteed DC operation of the device as specified in the DC electrical specifications.
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Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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