參數(shù)資料
型號(hào): MC10E1651
廠商: ON SEMICONDUCTOR
英文描述: 5V, -5V ECL Dual ECL Output Comparator With Latch(5V/-5V ECL,雙ECL輸出比較器(帶鎖存器))
中文描述: 5V的,- 5V的ECL雙ECL輸出比較器,鎖存(5V/-5V化學(xué)發(fā)光雙ECL輸出比較器(帶鎖存器))
文件頁(yè)數(shù): 6/10頁(yè)
文件大?。?/td> 155K
代理商: MC10E1651
MC10E1651
http://onsemi.com
6
DELAY DISPERSION
Under a constant set of input conditions comparators have
a specified nominal propagation delay. However, since
propagation delay is a function of input slew rate and input
voltage overdrive the delay dispersion parameters, T
DE
and
T
DT
, are provided to allow the user to adjust for these
variables (where T
DE
and T
DT
apply to inputs with standard
ECL and TTL levels, respectively).
Figure 4 and Figure 5 define a range of input conditions
which incorporate varying input slew rates and input voltage
overdrive. For input parameters that adhere to these
constraints the propagation delay can be described as:
T
NOM
±
T
DE
(or T
DT
)
where T
NOM
is the nominal propagation delay. T
NOM
accounts for nonuniformity introduced by temperature and
voltage variability, whereas the delay dispersion parameter
takes into consideration input slew rate and input voltage
overdrive variability. Thus a modified propagation delay can
be approximated to account for the effects of input conditions
that differ from those under which the parts where tested. For
example, an application may specify an ECL input with a
slew rate of 0.25 V/NS, an overdrive of 17 mV and a
temperature of 25
°
C, the delay dispersion parameter would
be 100 ps. The modified propagation delay would be
775 ps
±
100 ps
Figure 4. ECL Dispersion Test Input Conditions
Figure 5. TTL Dispersion Test Input Conditions
0 V
0.5 V
2.0 V
2.5 V
1.75 V
1.58 V
1.07 V
0.9 V
SLEW RATE = 0.75 V/NS
SLEW RATE = 0.75 V/NS
SLEW RATE =
0.25 V/NS
SLEW RATE =
0.30 V/NS
INPUT
THRESHOLD
RANGE
INPUT
THRESHOLD
RANGE
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