參數(shù)資料
型號: MAX5105EEP+T
廠商: Maxim Integrated Products
文件頁數(shù): 14/19頁
文件大?。?/td> 0K
描述: IC DAC 8BIT QUAD NV 20-QSOP
產品培訓模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標準包裝: 2,500
設置時間: 6µs
位數(shù): 8
數(shù)據(jù)接口: 串行
轉換器數(shù)目: 4
電壓電源: 單電源
功率耗散(最大): 727.3mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 20-SSOP(0.154",3.90mm 寬)
供應商設備封裝: 20-QSOP
包裝: 帶卷 (TR)
輸出數(shù)目和類型: 4 電壓,單極
采樣率(每秒): *
MAX5105/MAX5106
Nonvolatile, Quad, 8-Bit DACs
4
_______________________________________________________________________________________
ELECTRICAL CHARACTERISTICS (continued)
(VDD = VREFH_ = +2.7V to +5.5V, GND = VREFL_ = 0, CL = 100pF, TA = TMIN to TMAX, unless otherwise noted. Typical values are at
VDD = +3V and TA = +25°C.)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
DIGITAL TIMING
CLK Period
tCP
1
s
CLK High Time
tCH
300
ns
CLK Low Time
tCL
300
ns
CS High Time
tCSHT
150
ns
CS Setup Time
tCSS
100
ns
CS Hold Time
tCSH
0ns
DIN Setup Time
tDS
100
ns
DIN Hold Time
tDH
0ns
CLK to DOUT Valid Time
tCDV
CLOAD = 100pF
1
s
CLK to DOUT Propagation Delay
tCD
CLOAD = 100pF
1
s
DOUT Disable Time
tCSD
CLOAD = 100pF
250
ns
Nonvolatile Store Time
tBUSY
13
ms
NONVOLATILE MEMORY RELIABILITY
Data Retention
MIL STD-883 Test Method 1008
100
Years
Endurance
MIL STD-883 Test Method 1033
100,000
Stores
Note 1: Guaranteed monotonic.
Note 2: Gain error is: [100 x (VF0(MEAS) - ZCE - VF0(IDEAL))/VREFH]; where VF0(MEAS) is the DAC output voltage with input code
F0hex. VF0(IDEAL) is the ideal DAC output voltage with input code F0hex (i.e., (VREFH - VREFL)
× 240/256 + VREFL).
Note 3: In the voltage range, 0.5V < VOUT_ < VDD - 0.5V.
Note 4: Output settling time is measured from the 50% point of the rising edge of last CLK to 1/2LSB of VOUT’s final value for a code
transition from 10hex to F0hex. See Figure 4.
Note 5: Channel-to-channel crosstalk is defined as the coupling from one driven reference with input code = FFhex to any other
DAC output with the reference of that DAC at a constant value and input code = 00hex.
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