參數(shù)資料
型號: MAS281
廠商: Dynex Semiconductor Ltd.
英文描述: MIL-STD-1750A Microprocessor
中文描述: 符合MIL - STD - 1750A微處理器
文件頁數(shù): 41/55頁
文件大?。?/td> 551K
代理商: MAS281
MAS281
41/55
8.0 TIMING PARAMETERS
NO.
Parameter
Test Condition
(notes 1 & 9)
Min.
(note 2)
Max.
(note 2)
Units
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
RESET setup to SYNC lo (note 3)
RESET hold after SYNC lo (note 3)
RESET hi to RESET lo (note 3)
OSC hi to SYNC lo
OSC hi to SYNC hi
SYNC lo to SYNC lo (notes 4 & 5)
SYNC lo to AS hi (note 6)
SYNC lo to AS lo
SYNC lo to DS lo (read)
SYNC lo to DS hi (read)
SYNC lo to DS lo (write)
SYNC lo to DS hi (write) (note 5)
SYNC lo to DD lo
SYNC lo to DD hi
SYNC lo to Address valid
Address valid after SYNC lo
SYNC lo to AD Bus Hi-Z (read)
(notes 7 & 10)
SYNC lo to AD Bus active read) (note 10) Load 2
SYNC lo to Data valid (write)
Data valid after SYNC lo (write)
Data set up to SYNC lo (read)
Data hold after SYNC lo (read) (note 8)
SYNC lo to M/IO, RD/VV, IN/OP valid
M/IO, RD/WN, IN/OP valid after SYNC lo Load 1
RDY setup to OSC lo
RDY hold after OSC lo
SYNC lo to DMAE valid
DMAE valid after SYNC lo
DMAR setup to SYNC lo
DMAR hold after SYNC lo
-
-
2
10
10
5
T
- 2
1
T
- 10
2.5
T
- 10
3
T
- 5
10
3
T
- 5
4.5
T
-5
3
T
+ 20
20
-
3
T
+ 15
30
15
-
40
40
5
T
+ 2
1
T
+ 5
2.5
T
+ 15
3
T
+ 20
30
3
T
+ 22
4.5
T
+ 10
3
T
+ 60
60
68
-
ns
ns
SYNC
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 2
Load 2
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Load 2
-
15
-
12
20
0
-
5
15
5
-
5
20
10
3
T
+ 50
-
3
T
+ 45
-
-
-
70
-
-
-
75
-
-
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
18
19
20
21
22
23
24
25
26
27
28
29
30
Load 2
Load 2
Load 2
Load 1
Load 1
Load 1
NOTES:
Mil-Std-883, method 5005, subgroups 9, 10, 11
1. Unless otherwise noted, test condltions are as follows: OSC duty cycle = 50%, input rise and fall time < 5ns, timing
measured from 50% of VDD points.
2. t = 1 OSC period. 0.5t implies a 50% OSC duty cycle; fractional t’s may be adjusted to reflect actual OSC duty cycle.
3. Data obtained by characterisation or analysis, is not routinely measured.
4. Add 1t for potential branch cycle.
5. Add 1t for internal XIO cycle; nt for n memory wait states.
6. Excluding DMA or HOLD conditions.
7. Measured to pre-Hi-Z steady state
±
10% of VDD.
8. Measurement minus 1x10
-7
in [1-(VlL-0 5/VDD-0.5)] nsecs.
9. Output references SYNC, DMAK, and HLDAK drive into load 1.
10. Guaranteed by component LSI testing: not measured on microprocessor module.
Table 10. Timing Parameters
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