參數(shù)資料
型號(hào)： MAQ2909NL
廠商： Electronic Theatre Controls, Inc.
英文描述： RADIATION HARD MICROPROGRAM SEQUENCER
中文描述： 輻射硬微程序時(shí)序
文件頁(yè)數(shù)： 11/13頁(yè)
文件大?。?/td> 146K
代理商： MAQ2909NL
MA2909/11
11
RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
GEC Plessey Semiconductors can provide radiation
testing compliant with MIL-STD-883 test method 1019,
Ionizing Radiation (Total Dose).
Total Dose (Function to specification)*
3x10
5
Rad(Si)
Transient Upset (Stored data loss)
5x10
10
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Table 11: Radiation Hardness Parameters
ORDERING INFORMATION
For details of reliability, QA/QC, test and assembly
options, see ‘Manufacturing Capability and Quality
Assurance Standards’ Section 9.
Unique Circuit Designator
S
R
Q
Radiation Hard Processing
100 kRads (Si) Guaranteed
300 kRads (Si) Guaranteed
Radiation Tolerance
C
N
F
Ceramic DIL (Solder Seal)
Naked Die
Flatpack (Solder Seal)
Package Type
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
Assembly Process
(See Section 9 Part 2)
L
C
D
E
B
S
Rel 0
Rel 1
Rel 2
Rel 3/4/5/STACK
Class B
Class S
Reliability Level
MAx2911xxxxx
MAx2909xxxxx
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