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參數(shù)資料
| 型號： | MACH110-12JC |
| 廠商： | LATTICE SEMICONDUCTOR CORP |
| 元件分類： | PLD |
| 英文描述： | High-Density EE CMOS Programmable Logic |
| 中文描述： | EE PLD, 12 ns, PQCC44 |
| 封裝： | PLASTIC, LCC-44 |
| 文件頁數(shù)： | 2/24頁 |
| 文件大小： | 191K |
| 代理商： | MACH110-12JC |
MACH110-14/18/20 (Ind)
10
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
–65
°C to +150°C
. . . . . . . . . . .
Ambient Temperature
With Power Applied
–55
°C to +125°C
. . . . . . . . . . . . .
Supply Voltage with
Respect to Ground
–0.5 V to +7.0 V
. . . . . . . . . . . . .
DC Input Voltage
–0.5 V to VCC+ 0.5 V
. . . . . . . . . . . .
DC Output or I/O
Pin Voltage
–0.5 V to VCC+ 0.5 V
. . . . . . . . . . . . . . . .
Static Discharge Voltage
2001 V
. . . . . . . . . . . . . . . .
Latchup Current
(TA = –40
°C to +85°C)
200 mA
. . . . . . . . . . . . . . . . . .
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
INDUSTRIAL OPERATING RANGES
Ambient Temperature (TA)
Operating in Free Air
–40
°C to +85°C
. . . . . . . . . . . .
Supply Voltage (VCC)
with Respect to Ground
+4.5 V to +5.5 V
. . . . . . . . . .
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS over INDUSTRIAL operating ranges unless otherwise specified
Parameter
Symbol
Parameter Description
Test Conditions
Min
Typ
Max
Unit
VOH
Output HIGH Voltage
IOH = –3.2 mA, VCC = Min
2.4
V
VIN = VIH or VIL
VOL
Output LOW Voltage
IOL = 16 mA, VCC = Min
0.5
V
VIN = VIH or VIL
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH
2.0
V
Voltage for all Inputs (Note 1)
VIL
Input LOW Voltage
Guaranteed Input Logical LOW
0.8
V
Voltage for all Inputs (Note 1)
IIH
Input HIGH Current
VIN = 5.25 V, VCC= Max (Note 2)
10
A
IIL
Input LOW Current
VIN = 0 V, VCC= Max (Note 2)
–10
A
IOZH
Off-State Output Leakage
VOUT= 5.25 V, VCC= Max
10
A
Current HIGH
VIN = VIH or VIL (Note 2)
IOZL
Off-State Output Leakage
VOUT= 0 V, VCC= Max
–10
A
Current LOW
VIN = VIH or VIL (Note 2)
ISC
Output Short-Circuit Current
VOUT= 0.5 V, VCC= Max (Note 3)
–30
–160
mA
Supply Current (Typical)
VCC = 5 V, TA = 25
°C, f = 25 MHz (Note 4)
95
mA
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL(or IIH and IOZH).
3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second.
VOUT= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of
being loaded, enabled, and reset.
ICC
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