參數(shù)資料
型號: MAC7111MPV50
廠商: MOTOROLA INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, FLASH, 50 MHz, RISC MICROCONTROLLER, PQFP144
封裝: 20 X 20 MM, 0.50 MM PITCH, LQFP-144
文件頁數(shù): 29/48頁
文件大?。?/td> 1282K
代理商: MAC7111MPV50
35
MAC7100 Microcontroller Family Hardware Specifications
MOTOROLA
PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE
Electrical Characteristics
3.13.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase
cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
NOTE
All values shown in Table 37 are target values and subject to
characterization.
For Flash cycling performance, each Program operation must be preceded
by an erase.
Table 37. NVM Reliability Characteristics
Conditions shown in Table 6 unless otherwise noted.
Num
C
Rating
Min
Unit
Z10
C Program/Data Flash Program/Erase endurance (–40C to +125C)
10,000
Cycles
Z11
C Program/Data Flash Data Retention Lifetime
15
Years
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