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參數(shù)資料
| 型號： | M54HC4011F1R |
| 廠商： | 意法半導體 |
| 英文描述： | BCD TO 7 SEGMENT LATCH/DECODER DRIVER |
| 中文描述： | BCD碼中的7段鎖存器/解碼器驅(qū)動 |
| 文件頁數(shù)： | 1/13頁 |
| 文件大?。?/td> | 269K |
| 代理商： | M54HC4011F1R |
M54HC4511
M74HC4511
February 1993
BCD TO 7 SEGMENT LATCH/DECODER DRIVER
LOWPOWER DISSIPATION
I
CC
= 4
μ
A(MAX.) AT T
A
= 25
°
C
.
HIGH NOISE IMMUNITY
V
NIH
= V
NIL
= 28 % V
CC
(MIN.)
.
OUTPUT DRIVE CAPABILITY
10 LSTTL LOADS
.
HIGH SOURGE CURRENT
|I
OH
| = 20 mA (MIN.)
.
BALANCEDPROPAGATION DELAYS
t
PLH
= t
PHL
.
WIDE OPERATING VOLTAGE RANGE
V
CC
(OPR) = 2 V TO6 V
.
PIN ANDFUNCTION COMPATIBLE
WITH 4511B
B1R
(Plastic Package)
ORDER CODES :
M54HC4011F1R
M74HC4011B1R
M74HC4011M1R
M74HC4011C1R
F1R
(CeramicPackage)
M1R
(MicroPackage)
C1R
(Chip Carrier)
PIN CONNECTIONS
(top view)
NC =
No Internal
Connection
DESCRIPTION
The M54/74HC4511 is a high speed CMOS BCD-
TO-7 SEGMENT LATCH/DECODER/DRIVER fab-
ricated with silicon gate C
2
MOS technology. It
enables highspeedlatchanddecode operation with
identical pin connection and function to standard
CMOS 4511B.
The segment output driver, which is CMOS fabri-
cated in silicon gate C
2
MOS technology, has large
I
OH
capability whichenables common cathodeLeds
to be directly driven.
When lamp test (LT) is taken ”L”, all segment out-
puts will go to ”H”, and when blanking (BI)is taken
”L” and LT is taken ”H” all segment outputs will go
to ”L”.
These functions operate regardless of other inputs
and are used to test the display.
Input BI is used to pulse-modulate the brightness of
the display.
When an error input code (over 10) is applied to the
BCD input, all segment outputs will go ”L” (turn off).
All inputs are equipped with protection circuits
against static discharge and transient excess volt-
age.
.
HIGH SPEED
t
PD
= 28 ns(TYP.) AT V
CC
= 5 V
1/13
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