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DATA RETENTION MODE
With valid V
CC
applied, the M48Z08/18 operates as
a conventional BYTEWIDE
static RAM. Should
the supply voltage decay, the RAM will automat-
ically power-fail deselect, write protecting itself
when V
CC
falls within the V
PFD
(max), V
PFD
(min)
window. All outputs become high impedance, and
all inputs are treated as "don’t care."
Note:
A power failure during a write cycle may
corrupt data at the currently addressed location,
but does not jeopardize the rest of the RAM’s
content. At voltages below V
PFD
(min), the user can
be assured the memory will be in a write protected
state, provided the V
CC
fall time is not less than t
F
.
The M48Z08/18 may respond to transient noise
spikes on V
CC
that reach into the deselect window
during the time the device is sampling V
CC
. There-
fore, decoupling of the power supply lines is rec-
ommended.
When V
CC
drops below V
SO
, the control circuit
switches power to the internal battery which pre-
serves data and powers the clock. The internal
button cell will maintain data in the M48Z08/18 for
an accumulated period of at least 11 years when
V
CC
is less than V
SO
. As system power returns and
V
CC
rises above V
SO
, the battery is disconnected,
and the power supply is switched to external V
CC
.
Write protection continues until V
CC
reaches V
PFD
(min) plus t
REC
(min). E should be kept high as V
CC
rises past V
PFD
(min) to prevent inadvertent write
cycles prior to system stabilization. Normal RAM
operation can resume t
REC
after V
CC
exceeds
V
PFD
(max).
For more information on Battery Storage Life refer
to the Application Note AN1012.
SYSTEM BATTERY LIFE
The useful life of the battery in the M48Z08/18 is
expected to ultimately come to an end for one of
two reasons: either because it has been dis-
charged while providing current to the RAM in the
battery back-up mode, or because the effects of
aging render the cell useless before it can actually
be completely discharged. The two effects are
virtually unrelated, allowing discharge or Capacity
Consumption, and the effects of aging or Storage
Life, to be treated as two independent but simulta-
neous mechanisms. The earlier occurring failure
mechanism defines the battery system life of the
M48Z08/18.
AI01399
20
30
40
50
60
70
80
90
1
2
3
4
5
8
6
TEMPERATURE (Degrees Celsius)
10
20
30
40
50
Y
t50% (AVERAGE)
t1%
Figure 9. Predicted Battery Storage Life versus Temperature
9/18
M48Z08, M48Z18