參數資料
型號: LV47011P-E
廠商: ON Semiconductor
文件頁數: 3/10頁
文件大?。?/td> 0K
描述: IC AUDIO AMP BTL 50W 4CH HZIP25
標準包裝: 15
類型: AB 類
輸出類型: 4-通道(四路)
在某負載時最大輸出功率 x 通道數量: 29W x 4 @ 4 歐姆
電源電壓: 8 V ~ 16 V
特點: 靜音,短路和熱保護
安裝類型: *
供應商設備封裝: *
封裝/外殼: *
包裝: *
LV47011P
No.A1838-2/10
Specifications
Maximum Ratings at Ta = 25
C
Parameter
Symbol
Conditions
Ratings
Unit
Maximum supply voltage
VCC max1
No signal, t = 1 minute
26
V
VCC max2
During operations
18
V
Maximum output current
IO peak
Per channel
4.5/ch
A
Allowable power dissipation
Pd max
With an infinity heat sink
50
W
Operating temperature
Topr
-40 to +85
C
Storage temperature
Tstg
-40 to +150
C
Thermal resistance between the junction
and case
j-c
1
C/W
Recommended Operating Ranges at Ta = 25
C
Parameter
Symbol
Conditions
Ratings
Unit
Recommended supply voltage
VCC
14.4
V
Recommended load resistance
RL op
4
Operating supply voltage range
VCC op
A range not exceeding Pdmax
8 to 16
V
Electrical Characteristics at Ta = 25°C, VCC = 14.4V, RL = 4, f = 1kHz, Rg = 600
Parameter
Symbol
Conditions
Ratings
Unit
min
typ
max
Quiescent current
ICCO
RL = , Rg = 0
200
400
mA
Standby current
Ist
Vst = 0V
3
A
Voltage gain
VG
VO = 0dBm
25
26
27
dB
Voltage gain difference
VG
-1
+1
dB
Output power
PO
THD = 10%
24
29
W
PO max1
Max Power
45
W
PO max2
VCC = 15.2, Max Power
50
W
Output offset voltage
Vn offset
Rg = 0
-100
+100
mV
Total harmonic distortion
THD
PO = 4W
0.03
0.12
%
Channel separation
CHsep
VO = 0dBm, Rg = 10k
55
65
dB
Ripple rejection ratio
SVRR
Rg = 0
, fr = 100Hz, VCCR = 0dBm
50
65
dB
Output noise voltage
VNO
Rg = 0
, B.P.F. = 20Hz to 20kHz
80
150
Vrms
Input resistance
Ri
40
50
65
k
Mute attenuation
Matt
VO = 20dBm, mute : on
75
90
dB
Standby pin control voltage
Vstby H
Amp : on
2.5
VCC
V
Vstby L
Amp : off
0.0
0.5
V
Mute pin control voltage
Vmute H
Mute : off
Open
-
Vmute L
Mute : on
0.0
1.0
V
Output offset detection
Detection threshold voltage
Vosdet
1.2
1.8
2.4
V
* 0dBm = 0.775Vrms
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
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