參數(shù)資料
型號: LTC2259CUJ-16#TRPBF
廠商: LINEAR TECHNOLOGY CORP
元件分類: ADC
英文描述: PROPRIETARY METHOD ADC, PQCC40
封裝: 6 X 6 MM, LEAD FREE, PLASTIC, QFN-40
文件頁數(shù): 25/28頁
文件大小: 318K
代理商: LTC2259CUJ-16#TRPBF
LTC2259-16
6
225916f
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
fS
Sampling Frequency
(Note 10)
l
1
80
MHz
tL
ENC Low Time (Note 8)
Duty Cycle Stabilizer Off
Duty Cycle Stabilizer On
l
5.93
2.00
6.25
500
ns
tH
ENC High Time (Note 8)
Duty Cycle Stabilizer Off
Duty Cycle Stabilizer On
l
5.93
2.00
6.25
500
ns
tAP
Sample-and-Hold Acquisition Delay
Time
0ns
Digital Data Outputs (CMOS Modes: Full Data Rate and Double-Data Rate)
tD
ENC to Data Delay
CL = 5pF (Note 8)
l
1.1
1.7
3.1
ns
tC
ENC to CLKOUT Delay
CL = 5pF (Note 8)
l
1
1.4
2.6
ns
tSKEW
DATA to CLKOUT Skew
tD – tC (Note 8)
l
0
0.3
0.6
ns
Pipeline Latency
Full Data Rate Mode
Double-Data Rate Mode
5.0
5.5
Cycles
Digital Data Outputs (LVDS Mode)
tD
ENC to Data Delay
CL = 5pF (Note 8)
l
1.1
1.8
3.2
ns
tC
ENC to CLKOUT Delay
CL = 5pF (Note 8)
l
1
1.5
2.7
ns
tSKEW
DATA to CLKOUT Skew
tD – tC (Note 8)
l
0
0.3
0.6
ns
Pipeline Latency
5.5
Cycles
SPI Port Timing (Note 8)
tSCK
SCK Period
Write Mode
Readback Mode, CSDO = 20pF, RPULLUP = 2k
l
40
250
ns
tS
CS to SCK Setup Time
l
5ns
tH
SCK to CS Setup Time
l
5ns
tDS
SDI Setup Time
l
5ns
tDH
SDI Hold Time
l
5ns
tDO
SCK Falling to SDO Valid
Readback Mode, CSDO = 20pF, RPULLUP = 2k
l
125
ns
TIMING CHARACTERISTICS The l denotes the specications which apply over the full operating temperature
range, otherwise specications are at TA = 25°C. (Note 5)
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to GND with GND and OGND
shorted (unless otherwise noted).
Note 3: When these pin voltages are taken below GND or above VDD, they
will be clamped by internal diodes. This product can handle input currents
of greater than 100mA below GND or above VDD without latchup.
Note 4: When these pin voltages are taken below GND they will be
clamped by internal diodes. When these pin voltages are taken above VDD
they will not be clamped by internal diodes. This product can handle input
currents of greater than 100mA below GND without latchup.
Note 5: VDD = OVDD = 1.8V, fSAMPLE = 80MHz, LVDS outputs with internal
termination disabled, differential ENC+/ENC= 2VP-P sine wave, input
range = 2VP-P with differential drive, unless otherwise noted.
Note 6: Integral nonlinearity is dened as the deviation of a code from a
best t straight line to the transfer curve. The deviation is measured from
the center of the quantization band.
Note 7: Offset error is the offset voltage measured from –0.5 LSB when
the output code ickers between 0000 0000 0000 0000 and 1111 1111
1111 1111 in 2’s complement output mode.
Note 8: Guaranteed by design, not subject to test.
Note 9: VDD = 1.8V, fSAMPLE = 80MHz, ENC+ = single-ended 1.8V square
wave, ENC= 0V, input range = 2VP-P with differential drive, 5pF load on
each digital output unless otherwise noted.
Note 10: Recommended operating conditions.
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