![](http://datasheet.mmic.net.cn/Linear-Technology/LTC221CN-PBF_datasheet_98017/LTC221CN-PBF_5.png)
LTC221/LTC222
5
2212fa
Switching Time Test Circuit
Switch output waveform shown for VS = constant with
logic input waveform as shown. Note that VS may be (+)
or (–) as per switching time test circuit. VO is the steady
APPLICATIO S I FOR ATIO
WU
UU
state output switch on. Feedthrough via gate capacitance
may result in spikes at leading and trailing edge of output
waveform.
CCRR-Channel to Channel Crosstalk Test Circuit
Switching Time Test Circuit
Charge Injection Test Circuit
OIRR-Off Isolation Test Circuit
LTC221/222 AI01
VS
OV
3V
LTC222
LOGIC INPUT
tr < 20ns
LTC221
LOGIC INPUT
tr < 20ns
SWITCH
INPUT
SWITCH
OUTPUT
50%
VO
0.9
LOGIC "0" = SW ON
LOGIC "1" = SW ON
VO
tON
tOFF
LTC221/222 AI02
S1
D1
(REPEAT TEST FOR IN2, IN3 AND IN4)
VO
CL
35pF
RL
1k
RL
RL+ RDS(ON)
VO = VS
IN1
SWITCH
OUTPUT
SWITCH
INPUT
LOGIC
INPUT
VS = 2V
LTC221/222 AI03
SX
RGEN
VGEN
DX
INX
VO
CL = 1000pF
LTC221/222 AI04
OV
3V
VO
LTC221 INX
LTC222 INX
VO
VO IS THE MEASURED VOLTAGE ERROR DUE TO CHARGE INJECTION.
THE ERROR VOLTAGE IN COULOMBS IS Q = VL VO
OFF
ON
LTC221/222 AI05
VS V+
V–
C
OIRR = 20 LOG
C = 0.001F//0.1F
CHIP CAPACITORS
SIGNAL
GENERATOR
C
15V
–15V
VD
GND
VIN
INX
VS
VD
RL
1k
VS = 2VP-P
f = 100kHz
CHAN A
ANALYZER
CHAN B
LTC221/222 AI06
VS1 V
+
V–
C
OIRR = 20 LOG
C = 0.001F//0.1F
CHIP CAPACITORS
SIGNAL
GENERATOR
C
NC
50
15V
–15V
VD2
VS2
VD1
VL
GND
VIN
IN2
IN1
VS1
VD2
RL
1k
VS = 2Vp-p
f = 100kHz
CHAN A
ANALYZER
CHAN B