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參數(shù)資料
| 型號(hào)： | LTC1287BIN |
| 廠商： | LINEAR TECHNOLOGY CORP |
| 元件分類： | ADC |
| 英文描述： | 3V Single Chip 12-Bit Data Acquisition System |
| 中文描述： | 12-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDIP8 |
| 封裝： | PLASTIC, DIP-8 |
| 文件頁(yè)數(shù)： | 3/16頁(yè) |
| 文件大?。?/td> | 324K |
| 代理商： | LTC1287BIN |
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LTC1287
3
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
V
IH
V
IL
I
IH
I
IL
V
OH
High Level Input Voltage
V
CC
= 3.6V
V
CC
= 3.0V
V
IN
= V
CC
V
IN
= 0V
V
CC
= 3.0V, I
O
= 20
μ
A
I
O
= 400
μ
A
V
CC
= 3.0V, I
O
= 20
μ
A
I
O
= 400
μ
A
V
OUT
= V
CC
, CS High
V
OUT
= 0V, CS High
V
OUT
= 0V
V
OUT
= V
CC
CS High
G
2.1
V
Low Level Input Voltage
G
0.45
V
High Level Input Current
G
2.5
μ
A
Low Level Input Current
G
–2.5
μ
A
High Level Output Voltage
2.90
2.85
V
V
G
2.7
V
OL
Low Level Output Voltage
0.05
0.10
V
V
G
0.3
I
OZ
High Z Output Leakage
G
G
3
μ
A
μ
A
–3
I
SOURCE
I
SINK
I
CC
I
REF
Output Source Current
–10
mA
Output Sink Current
9
mA
Positive Supply Current
G
1.5
5
mA
Reference Current
V
REF
= 2.5V
G
10
50
μ
A
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
t
hDO
t
f
t
r
t
WHCLK
t
WLCLK
t
suCS
t
WHCS
t
WLCS
C
IN
Time Output Data Remains Valid After CLK
↓
50
ns
D
OUT
Fall Time
D
OUT
Rise Time
CLK High Time
See Test Circuits
G
40
100
ns
See Test Circuits
G
40
100
ns
V
CC
= 3V (Note 6)
V
CC
= 3V (Note 6)
V
CC
= 3V (Note 6)
V
CC
= 3V (Note 6)
V
CC
= 3V (Note 6)
Analog Inputs On Channel
Analog Inputs Off Channel
Digital Inputs
600
ns
CLK Low Time
800
ns
Setup Time, CS
↓
Before CLK
↑
100
ns
CS High Time Between Data Transfer Cycles
5.0
μ
s
CS Low Time During Data Transfer
14
CLK Cycles
Input Capacitance
100
5
5
pF
pF
pF
AC CHARACTERISTICS
LTC1287B/LTC1287C
ELECTRICAL C
HARA TER STICS
DIGITAL A D
U
DC
(Note 3)
(Note 3)
The
G
denotes specifications which apply over the operating temperature
range; all other limits and typicals T
A
= 25
°
C.
Note 1:
Absolute Maximum Ratings are those values beyond which the life
of a device may be impaired.
Note 2:
All voltage values are with respect to ground (unless otherwise
noted).
Note 3:
V
CC
= 3V, V
REF
= 2.5V, CLK = 500kHz unless otherwise specified.
Note 4:
One LSB is equal to V
REF
divided by 4096. For example, when V
REF
= 2.5V, 1LSB = 2.5V/4096 = 0.61mV.
Note 5:
Integral nonlinearity error is defined as the deviation of a code
from a straight line passing through the actual endpoints of the transfer
curve. The deviation is measured from the center of the quantization band.
LTC1287B/LTC1287C
Note 6:
Recommended operating conditions.
Note 7:
Two on-chip diodes are tied to each analog input which will
conduct for analog voltages one diode drop below GND or one diode drop
above V
CC
. Be careful during testing at low V
CC
levels, as high level analog
inputs can cause this input diode to conduct, especially at elevated
temperature, and cause errors for inputs near full scale. This spec allows
50mV forward bias of either diode. This means that as long as the analog
input does not exceed the supply voltage by more than 50mV, the output
code will be correct.
Note 8:
Channel leakage current is measured after the channel selection.
Note 9:
Increased leakage currents at elevated temperatures cause the S/
H to droop, therefore it is recommended that f
CLK
≥
30kHz at 85
°
C and
f
CLK
≥
3kHz at 25
°
C.
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