SWITCHING CHARACTERISTICS The l
參數(shù)資料
型號: LT1785IS8#PBF
廠商: Linear Technology
文件頁數(shù): 12/16頁
文件大?。?/td> 0K
描述: IC TXRX RS485/RS422 60V 8-SOIC
標(biāo)準(zhǔn)包裝: 100
類型: 收發(fā)器
驅(qū)動器/接收器數(shù): 1/1
規(guī)程: RS422,RS485
電源電壓: 4.75 V ~ 5.25 V
安裝類型: 表面貼裝
封裝/外殼: 8-SOIC(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 8-SOIC
包裝: 管件
產(chǎn)品目錄頁面: 1354 (CN2011-ZH PDF)
LT1785/LT1785A/
LT1791/LT1791A
5
178591fc
SWITCHING CHARACTERISTICS The l denotes the specications which apply over the full operating
temperature range, otherwise specications are at TA = 25°C, VCC = 5V.
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
tPLH
Driver Input to Output
Figures 3, 5
l
700
2000
ns
tPHL
Driver Input to Output
Figures 3, 5
l
700
2000
ns
tSKEW
Driver Output to Output
Figures 3, 5
100
ns
tr, tf
Driver Rise or Fall Time
Figures 3, 5
l
200
800
2000
ns
tZH
Driver Enable to Output High
Figures 4, 6
l
500
3000
ns
tZL
Driver Enable to Output Low
Figures 4, 6
l
800
3000
ns
tLZ
Driver Disable Time from Low
Figures 4, 6
l
200
5000
ns
tHZ
Driver Disable Time from High
Figures 4, 6
l
800
5000
ns
tPLH
Receiver Input to Output
Figures 3, 7
l
400
900
ns
tPHL
Receiver Input to Output
Figures 3, 7
l
400
900
ns
tSKD
Differential Receiver Skew
200
ns
tZL
Receiver Enable to Output Low
Figures 2, 8
l
300
1000
ns
tZH
Receiver Enable to Output High
Figures 2, 8
l
300
1000
ns
tLZ
Receiver Disable from Low
Figures 2, 8
l
400
1000
ns
tHZ
Receiver Disable from High
Figures 2, 8
l
400
1000
ns
fMAX
Maximum Data Rate
l
250
kbps
tSHDN
Time to Shut Down
Figures 2, 6, 8
3
μs
tZH(SHDN)
Driver Enable from Shutdown to Output High
Figures 2, 6; RE = 5V
12
μs
tZL(SHDN)
Driver Enable from Shutdown to Output Low
Figures 2, 6; RE = 5V
12
μs
tZH(SHDN)
Receiver Enable from Shutdown to Output High
Figures 2, 8; DE = 0V
4
μs
tZL(SHDN)
Receiver Enable from Shutdown to Output Low
Figures 2, 8; DE = 0V
4
μs
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
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