參數(shù)資料
型號(hào)： LT1128CS8#TRPBF
廠商： Linear Technology
文件頁(yè)數(shù)： 4/28頁(yè)
文件大?。?/td> 0K
描述： IC OP-AMP LOW NOISE SNGL 8-SOIC
標(biāo)準(zhǔn)包裝： 2,500
放大器類型： 通用
電路數(shù)： 1
轉(zhuǎn)換速率： 6 V/µs
增益帶寬積： 20MHz
電流 - 輸入偏壓： 30nA
電壓 - 輸入偏移： 20µV
電流 - 電源： 7.6mA
電壓 - 電源，單路/雙路(±)： ±4 V ~ 18 V
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 8-SOIC（0.154"，3.90mm 寬）
供應(yīng)商設(shè)備封裝： 8-SO
包裝： 帶卷 (TR)
LT1028/LT1128
12
1028fb
applicaTions inForMaTion – noise
Noise Testing – Voltage Noise
The LT1028/LT1128’s RMS voltage noise density can be
accurately measured using the Quan Tech Noise Analyzer,
Model 5173 or an equivalent noise tester. Care should be
taken, however, to subtract the noise of the source resistor
used. Prefabricated test cards for the Model 5173 set the
device under test in a closed-loop gain of 31 with a 60Ω
source resistor and a 1.8k feedback resistor. The noise
of this resistor combination is 0.13√58 = 1.0nV/√Hz. An
LT1028/LT1128 with 0.85nV/√Hz noise will read (0.852 +
1.02)1/2 = 1.31nV/√Hz. For better resolution, the resistors
should be replaced with a 10Ω source and 300Ω feedback
resistor. Even a 10Ω resistor will show an apparent noise
which is 8% to 10% too high.
The 0.1Hz to 10Hz peak-to-peak noise of the LT1028/
LT1128 is measured in the test circuit shown. The fre-
quency response of this noise tester indicates that the
0.1Hz corner is defined by only one zero. The test time
to measure 0.1Hz to 10Hz noise should not exceed 10
seconds, as this time limit acts as an additional zero to
eliminate noise contributions from the frequency band
below 0.1Hz.
Measuring the typical 35nV peak-to-peak noise per-
formance of the LT1028/LT1128 requires special test
precautions:
(a) The device should be warmed up for at least five
minutes. As the op amp warms up, its offset voltage
changes typically 10V due to its chip temperature
increasing 30°C to 40°C from the moment the power
supplies are turned on. In the 10 second measurement
interval these temperature-induced effects can easily
exceed tens of nanovolts.
(b) For similar reasons, the device must be well shielded
from air current to eliminate the possibility of ther-
moelectric effects in excess of a few nanovolts, which
would invalidate the measurements.
(c) Sudden motion in the vicinity of the device can also
feedthrough to increase the observed noise.
Anoise-voltagedensitytestisrecommendedwhenmeasur-
ing noise on a large number of units. A 10Hz noise-voltage
density measurement will correlate well with a 0.1Hz to
10Hz peak-to-peak noise reading since both results are
determined by the white noise and the location of the 1/f
corner frequency.
Figure 2. 0.1Hz to 10Hz Noise Test Circuit
Figure 3. 0.1Hz to 10Hz Peak-to-Peak
Noise Tester Frequency Response
–
+
VOLTAGE GAIN = 50,000
* DEVICE UNDER TEST
NOTE ALL CAPACITOR VALUES ARE FOR
NONPOLARIZED CAPACITORS ONLY
100k
10
–
+
2k
4.7F
0.1F
100k
24.3k
22F
2.2F
4.3k
110k
SCOPE
× 1
RIN = 1M
0.1F
*
1028 F02
LT1001
FREQUENCY (Hz)
40
GAIN
(dB)
60
70
90
100
0.01
1.0
10
100
1028 F03
30
0.1
50
80
相關(guān)PDF資料
PDF描述
2026-15-C18 GAS DISCHARGE TUBE 3 POLE
77311-118-32LF BERGSTIK
LT1128CS8#TR IC OPAMP PREC LOWNOISE HS 8SOIC
2026-09-CBLF GAS DISCHARGE TUBE 3 POLE
0001.1001 FUSE 500MA 250V 5X20 FAST CERM
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