參數(shù)資料
型號(hào)： LT1028M
廠商： Linear Technology Corporation
英文描述： Hex Noninverting Drivers 14-SOIC 0 to 70
中文描述： 超低噪聲精密高速運(yùn)算放大器
文件頁(yè)數(shù)： 11/20頁(yè)
文件大?。?/td> 439K
代理商： LT1028M
11
LT1028/LT1128
U
S
A
O
PPLICATI
U
U
0.1Hz to 10Hz Noise Test Circuit
0.1Hz to 10Hz Peak-to-Peak Noise
Tester Frequency Response
FREQUENCY (Hz)
40
G
60
70
90
100
0.01
1.0
10
100
LT1028/1128 AI03
30
0.1
50
80
–
+
VOLTAGE GAIN = 50,000
* DEVICE UNDER TEST
NOTE ALL CAPACITOR VALUES ARE FOR
NONPOLARIZED CAPACITORS ONLY
100k
100
–
+
2k
4.7
μ
F
0.1
μ
F
100k
24.3k
22
μ
F
2.2
μ
F
4.3k
110k
SCOPE
×
1
R
IN
= 1M
0.1
μ
F
*
1028/1128 AI02
LT1001
–U
Noise Testing – Voltage Noise
The LT1028/LT1128's RMS voltage noise density can be
accurately measured using the Quan Tech Noise Analyzer,
Model 5173 or an equivalent noise tester. Care should be
taken, however, to subtract the noise of the source resistor
used. Prefabricated test cards for the Model 5173 set the
device under test in a closed-loop gain of 31 with a 60
source resistor and a 1.8k feedback resistor. The noise of
this resistor combination is 0.13
√
58 = 1.0nV/
√
Hz. An
LT1028/LT1128 with 0.85nV/
√
Hz noise will read (0.85
2
+
1.0
2
)
1/2
= 1.31nV/
√
Hz. For better resolution, the resistors
should be replaced with a 10
source and 300
feedback
resistor. Even a 10
resistor will show an apparent noise
which is 8% to 10% too high.
The 0.1Hz to 10Hz peak-to-peak noise of the LT1028/
LT1128 is measured in the test circuit shown. The fre-
quency response of this noise tester indicates that the
0.1Hz corner is defined by only one zero. The test time to
measure 0.1Hz to 10Hz noise should not exceed 10
seconds, as this time limit acts as an additional zero to
eliminate noise contributions from the frequency band
below 0.1Hz.
Measuring the typical 35nV peak-to-peak noise perfor-
mance of the LT1028/LT1128 requires special test pre-
cautions:
(a) The device should be warmed up for at least five
minutes. As the op amp warms up, its offset voltage
changes typically 10
μ
V due to its chip temperature
increasing 30
°
C to 40
°
C from the moment the power
supplies are turned on. In the 10 second measure-
ment interval these temperature-induced effects can
easily exceed tens of nanovolts.
(b) For similar reasons, the device must be well shielded
from air current to eliminate the possibility of thermo-
electric effects in excess of a few nanovolts, which
would invalidate the measurements.
(c) Sudden motion in the vicinity of the device can also
“feedthrough” to increase the observed noise.
A noise-voltage density test is recommended when mea-
suring noise on a large number of units. A 10Hz noise-
voltage density measurement will correlate well with a
0.1Hz to 10Hz peak-to-peak noise reading since both
results are determined by the white noise and the location
of the 1/f corner frequency.
相關(guān)PDF資料
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