參數(shù)資料
型號: LPV511MGX
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 運算放大器
英文描述: 880 nA, Rail-to-Rail Input and Output Operational Amplifier
中文描述: OP-AMP, 3800 uV OFFSET-MAX, 0.027 MHz BAND WIDTH, PDSO5
封裝: SC-70, 5 PIN
文件頁數(shù): 5/14頁
文件大?。?/td> 836K
代理商: LPV511MGX
12V Electrical Characteristics
(Note 5)
(Continued)
Unless otherwise specified, all limits are guaranteed for T
= 25C, V
+
= 12V, V
= 0V, V
CM
= V
O
= V
+
/2, and R
L
= 100 k
to
V
+
/2.
Boldface limits apply to the temperature range of 40C to 85C.
Symbol
Parameter
Conditions
Min
(Note 6)
5.25
3.10
Typ
(Note 7)
Max
(Note 6)
Units
SR
Slew Rate (Note 11)
A
V
= +1, V
O
ramped from 1V to 11V
7.0
V/ms
GBW
Gain Bandwidth Product
Phase Margin
Input-Referred Voltage Noise
Input-Referred Current Noise
R
L
= 1 M
, C
L
= 50 pF
R
L
= 1 M
, C
L
= 50 pF
f = 100 Hz
f = 10 Hz
f = 1 kHz
25
52
320
.02
.01
kHz
deg
e
n
i
n
nV/
pA/
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables.
Note 2:
Human Body Model: 1.5 k
in series with 100 pF. Machine Model: 0
in series with 200 pF.
Note 3:
The maximum power dissipation is a function of T
J(MAX)
,
θ
JA
, and T
A
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
- T
A
)/
θ
JA
. All numbers apply for packages soldered directly onto a PC board.
Note 4:
Output short circuit duration is infinite for V
+
<
6V at room temperature and below. For V
+
>
6V, allowable short circuit duration is 1.5 ms.
Note 5:
Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device.
Note 6:
Limits are 100% production tested at 25C. Limits over the operating temperature range are guaranteed through correlations using the Statistical Quality
Control (SQC) method.
Note 7:
Typical values represent the most likely parametric norm at the time of characterization.
Note 8:
Offset voltage average drift is determined by dividing the change in V
OS
at temperature extremes into the total temperature change.
Note 9:
Positive current corresponds to current flowing into the device.
Note 10:
The Short Circuit Test is a momentary test. See (Note 4).
Note 11:
Slew rate is the average of the rising and falling slew rates.
L
www.national.com
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