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參數(shù)資料
| 型號： | LP064V1 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | LP064V1 LIQUID CRYSTAL DISPLAY |
| 中文描述： | LP064V1液晶顯示器 |
| 文件頁數(shù)： | 14/20頁 |
| 文件大小： | 249K |
| 代理商： | LP064V1 |
LP064V1 LIQUID CRYSTAL DISPLAY
SPECIFICATIONS
TITLE: LP064V1 REV. 1 PAGE 14
OF 14
DATA DISPLAY AG
Industriestrasse 1
D-82110 Germering
DEZ 1999
http://www.datadisplay.de
Tel.: +49-89-894450-0
Fax: +49-89-894450-90
11. RELIABILITY
No.
1
2
3
Test ITEM
Conditions
High temperature storage test
Low temperature storage test
High temperature
& high humidity operation test
High temperature operation test Ta = 50° 240 h
Low temperature operation test
Vibration test
(non-operating)
Ta = 60° 240 h
Ta = -20° 240 h
Ta = 40° 95% 240 h
(no condensation)
4
5
6
Ta = 0° 240 h
Frequency: 10~57Hz / Vibration Width (one side):
0.075mm
58 ~ 500Hz / Gravity: 9.8m/s
2
Sweep time: 11 minutes
Test period: 3 hours
(1 hour for each direction of X,Y,Z)
Max. Gravity: 490 m/s
Pulse width: 11 ms, half sine wave
Direction: ±X,±Y,±Z
one for each direction
7
Shock test
(non-operating)
Result Evaluation Criteria
There should be no change which might affect the practical display function when
the display quality test is conducted under normal operating condition.
In High temperature and low temperature operation test, lamp current should be
5 mA.
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