參數(shù)資料
型號: LM494CN
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 穩(wěn)壓器
英文描述: Pulse Width Modulated Control Circuit
中文描述: 0.25 A SWITCHING CONTROLLER, 300 kHz SWITCHING FREQ-MAX, PDIP16
封裝: PLASTIC, DIP-16
文件頁數(shù): 4/8頁
文件大小: 159K
代理商: LM494CN
Functional Description
The basic oscillator (switching) frequency is controlled by an
external resistor (R
T
) and capacitor (C
T
). The relationship
between the values of R
T
, C
T
and frequency is shown in
Figure 10.
The level of the sawtooth wave form is compared with an
error voltage by the pulse width modulated comparator. The
output of the PWM Comparator directs the pulse steering
flip-flop and the output control logic.
The error voltage is generated by the error amplifier. The
error amplifier boosts the voltage difference between the
output and the 5.0V internal reference. See Figure 7 for
error amp sensing techniques. The second error amp is typi-
cally used to implement current-limiting.
The output control logic selects either push-pull or single-
ended operation of the output transistors (see Figure 6 ).
The dead time control prevents on-state overlap of the out-
put transistors as can be seen inFigure 5. The dead time is
approximately 3.0% or 5.0% of the total period if the dead
time control is grounded. This dead time can be increased
by connecting the dead time control to a voltage up to 5.0V.
The frequency response of the error amps (Figure 11) can
be modified by using external resistors and capacitors.
These components are typically connected between the
compensation terminal and the inverting input of the error
amps.
The switching frequency of two or more LM494 circuits can
be synchronized. The timing capacitor, C
T
, is connected as
shown inFigure 8. Charging current is provided by the mas-
ter circuit. Discharging is through all the circuits slaved to
the master. R
T
is required only for the master circuit.
Test Circuits
TL/H/10056–3
FIGURE 1. Error Amplifier Test Circuit
TL/H/10056–4
FIGURE 2. Current Limit Sense
Amplifier Test Circuit
TL/H/10056–5
TL/H/10056–6
FIGURE 3. Common Emitter Configuration
Test Circuit and Waveform
TL/H/10056–7
TL/H/10056–8
FIGURE 4. Emitter Follower Configuration
Test Circuit and Waveform
TL/H/10056–9
FIGURE 5. Dead Time and Feedback
Control Test Circuit
4
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