
Absolute Maximum Ratings
(Note 1)
Supply Voltage
Output Voltage
Output Current
Storage Temperature
Lead Temperature
SOT Package (Note 2):
Vapor Phase (60 seconds)
Infrared (15 seconds)
a
12V to
b
0.2V
a
V
S
a
0.6V to
b
1.0V
10 mA
b
65
§
C to
a
150
§
C
215
§
C
220
§
C
ESD Susceptibility (Note 3):
Human Body Model
Machine Model
2000V
TBD
Operating Ratings
(Note 1)
Specified Temperature Range
(Note 4)
LM45B, LM45C
T
MIN
to T
MAX
b
20
§
C to
a
100
C
Operating Temperature Range
LM45B, LM45C
Supply Voltage Range (
a
V
S
)
b
40
§
C to
a
125
§
C
a
4.0V to
a
10V
Electrical Characteristics
Unless otherwise noted, these specifications apply for
a
V
S
e a
5Vdc and I
LOAD
e
a
50
m
A, in the circuit of Figure 2. These specifications also apply from
a
2.5
§
C to T
MAX
in the circuit of Figure 1 for
a
V
S
e
a
5Vdc.
Boldface limits apply for T
A
e
T
J
e
T
MIN
to T
MAX
; all other limits T
A
T
J
e a
25
§
C, unless otherwise noted.
Parameter
Conditions
LM45B
LM45C
(Limit)
Units
Typical
Limit
(Note 5)
Typical
Limit
(Note 5)
Accuracy
(Note 6)
T
A
ea
25
§
C
T
A
e
T
MAX
T
A
e
T
MIN
g
2.0
g
3.0
g
3.0
g
3.0
g
4.0
g
4.0
§
C (max)
§
C (max)
§
C (max)
§
C (max)
Nonlinearity
(Note 7)
T
MIN
s
T
A
s
T
MAX
g
0.8
g
0.8
Sensor Gain
(Average Slope)
T
MIN
s
T
A
s
T
MAX
a
9.7
a
10.3
a
9.7
a
10.3
mV/
§
C (min)
mV/
§
C (max)
Load Regulation (Note 8)
0
s
I
L
s
a
1 mA
g
35
g
35
mV/mA (max)
Line Regulation
(Note 8)
a
4.0V
s
a
V
S
s
a
10V
g
0.80
g
1.2
g
0.80
g
1.2
mV/V (max)
mV/V (max)
Quiescent Current
(Note 9)
a
4.0V
s
a
V
S
s
a
10V,
a
25
§
C
a
4.0V
s
a
V
S
s
a
10V
4.0V
s
a
V
S
s
10V
120
160
120
160
m
A (max)
m
A (max)
Change of Quiescent
Current (Note 8)
2.0
2.0
m
A (max)
Temperature Coefficient
of Quiescent Current
a
2.0
a
2.0
m
A/
§
C
Minimum Temperature
for Rated Accuracy
In circuit of
Figure 1, I
L
e
0
T
J
e
T
MAX
, for 1000 hours
a
2.5
a
2.5
§
C (min)
Long Term Stability (Note 10)
g
0.12
g
0.12
§
C
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions.
Note 2:
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices.
Note 3:
Human body model, 100 pF discharged through a 1.5 k
X
resistor. Machine model, 200 pF discharged directly into each pin.
Note 4:
Thermal resistance of the SOT-23 package is 260
§
C/W, junction to ambient when attached to a printed circuit board with 2 oz. foil as shown inFigure 3.
Note 5:
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6:
Accuracy is defined as the error between the output voltage and 10 mv/
§
C times the device’s case temperature, at specified conditions of voltage, current,
and temperature (expressed in
§
C).
Note 7:
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 8:
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance.
Note 9:
Quiescent current is measured using the circuit of Figure 1.
Note 10:
For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur.
2