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  • 參數(shù)資料
    型號: LH28F400SUE-NC80
    廠商: Sharp Corporation
    英文描述: 4M (512K 】 8, 256K 】 16) Flash Memory
    中文描述: 4分(為512k】8,256K】16)快閃記憶體
    文件頁數(shù): 27/35頁
    文件大?。?/td> 294K
    代理商: LH28F400SUE-NC80
    4M (512K × 8, 256K × 16) Flash Memory
    LH28F400SU-NC
    27
    AC Characteristics for WE
    - Controlled Command Write Operations
    1
    V
    CC
    = 5.0 V ± 0.5 V, T
    A
    = 0°C to +70°C
    NOTES:
    1. Read timing during write and erase are the same as for normal read.
    2. Refer to command definition tables for valid address and data values.
    3. Sampled, but not 100% tested.
    4. Write/Erase durations are measured to valid Status Register (CSR) Data.
    5. Byte write operations are typically performed with 1 Programming Pulse.
    6. Address and Data are latched on the rising edge of WE
    for all Command Write operations.
    SYMBO-
    L
    PARAMETER
    TYP.
    V
    CC
    = 5.0 V ± 0.25 V
    V
    CC
    = 5.0 V ± 0.5 V
    UNITS
    NOTE
    MIN.
    MAX.
    MIN.
    MAX.
    t
    AVAV
    Write Cycle Time
    60
    70
    ns
    t
    VPWH
    V
    PP
    Set up to WE Going High
    100
    100
    ns
    3
    t
    PHEL
    RP
    Setup to CE
    Going Low
    400
    430
    ns
    t
    ELWL
    CE
    Setup to WE Going Low
    0
    0
    ns
    t
    AVWH
    Address Setup to WE Going High
    55
    60
    ns
    2, 6
    t
    DVWH
    Data Setup to WE Going High
    55
    60
    ns
    2, 6
    t
    WLWH
    WE Pulse Width
    55
    60
    ns
    t
    WHDX
    Data Hold from WE High
    0
    0
    ns
    2
    t
    WHAX
    Address Hold from WE High
    10
    10
    ns
    2
    t
    WHEH
    CE
    Hold from WE High
    10
    10
    ns
    t
    WHWL
    WE Pulse Width High
    30
    30
    ns
    t
    GHWL
    Read Recovery before Write
    0
    0
    ns
    t
    WHRL
    WE High to RY
    /BY
    Going Low
    100
    100
    ns
    t
    RHPL
    RP
    Hold from Valid Status Register
    Data and RY
    /BY
    High
    0
    0
    ns
    3
    t
    PHWL
    RP
    High Recovery to WE Going Low
    1
    1
    μs
    t
    WHGL
    Write Recovery before Read
    60
    65
    ns
    t
    QVVL
    V
    PP
    Hold from Valid Status Register
    Data and RY
    /BY
    High
    0
    0
    μs
    t
    WHQV1
    t
    WHQV2
    Duration of Byte Write Operation
    13
    4.5
    4.5
    μs
    4, 5
    Duration of Block Erase Operation
    0.3
    0.3
    s
    4
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