參數(shù)資料
型號(hào)： LH28F400BG-TL85
廠商： Sharp Corporation
英文描述： 4M-BIT (256KB x16) SmartVoltage Flash MEMORY
中文描述： 4分位（256KB的x16）的SmartVoltage閃存
文件頁(yè)數(shù)： 20/35頁(yè)
文件大?。?/td> 294K
代理商： LH28F400BG-TL85
LH28F400SU-NC
4M (512K × 8, 256K × 16) Flash Memory
20
Timing Nomenclature
For 5.0 V systems use the standard JEDEC cross point definitions.
Each timing parameter consists of 5 characters. Some common examples are defined below:
t
CE
t
OE
t
ACC
t
AVQV
t
AS
t
DH
t
ELQV
t
GLQV
time (t) from CE
(E) going low (L) to the outputs (Q) becoming valid (V)
time (t) from OE
(G) going low (L) to the outputs (Q) becoming valid (V)
time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)
t
AVWH
t
WHDX
time (t) from address (A) valid (V) to WE
(W) going high (H)
time (t) from WE
(W) going high (H) to when the data (D) can become undefined (X)
Figure 15. Transient Input/Output
Reference Waveform (V
CC
= 5.0 V ±0.5 V)
Figure 17. Transient Equivalent Testing
Load Circuit (V
CC
= 5.0 V ±0.5 V)
PIN CHARACTERS
PIN STATES
A
Address Inputs
H
High
D
Data Inputs
L
Low
Q
Data Outputs
V
Valid
E
CE
(Chip Enable)
X
Driven, but not necessarily valid
G
OE
(Output Enable)
Z
High Impedance
W
WE (Write Enable)
P
RP
(Deep Power-Down Pin)
R
RY
/BY
(Ready/Busy)
V
Any Voltage Level
5 V
V
CC
at 4.5 V Min.
INPUT
TEST POINTS
OUTPUT
2.4
0.45
2.0
0.8
2.0
0.8
28F400SUT-NC60-13
NOTE:
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic '1' and V
OL
(0.45 V
TTL
) for a Logic '0'. Input timing begins at V
IH
(2.0 V
TTL
)
and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise
and fall times (10% to 90%) < 10 ns.
Figure 16. Transient Input/Output
Reference Waveform (V
CC
= 5.0 V ±.25 V)
2.5 ns OF 25
TRANSMISSION LINE
TOTAL CAPACITANCE = 100 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F400SUT-NC60-15
Figure 18. Transient Equivalent Testing
Load Circuit (V
CC
= 5.0 V ±.25 V)
2.5 ns OF 83
TRANSMISSION LINE
TOTAL CAPACITANCE = 30 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F400SUT-NC60-16
INPUT
0.0
TEST POINTS
OUTPUT
3.0
1.5
1.5
28F400SUT-NC60-14
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1'
and 0.0 V for a Logic '0'. Input timing begins,
and output timing ends at 1.5 V. Input rise
and fall times (10% to 90%) < 10 ns.
相關(guān)PDF資料
PDF描述
LH28F400SU-NC 4M (512K 】 8, 256K 】 16) Flash Memory
LH28F400SUHN-NC80 4M Flash Memory
LH28F400SUHT-NC80 4Mbit(512Kbit x 8,256 Kbit x 16) 5V Single Voltage Flash Memory
LH28F400SUHE-NC80 4Mbit(512Kbit x 8, 256 Kbit x 16) 5V Single Voltage Flash Memory
LH28F400BVHE-BL85 4M Flash Memory
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
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LH28F400BVE-BL85 制造商:SHARP 制造商全稱(chēng):Sharp Electrionic Components 功能描述:4M Flash Memory
LH28F400BVE-TL85 制造商:SHARP 制造商全稱(chēng):Sharp Electrionic Components 功能描述:4M Flash Memory
LH28F400BVHB-TL85 制造商:未知廠家 制造商全稱(chēng):未知廠家 功能描述:x8/x16 Flash EEPROM
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