參數(shù)資料
型號(hào): LH28F004SU-NC
廠商: Sharp Corporation
英文描述: 4M (512K 】 8) Flash Memory
中文描述: 4分(為512k】8)閃存
文件頁數(shù): 25/31頁
文件大小: 249K
代理商: LH28F004SU-NC
4M (512K × 8) Flash Memory
LH28F004SU-LC
25
AC Characteristics for WE
- Controlled Command Write Operations
1
V
CC
= 3.3 V ± 0.3 V, T
A
= 0°C to +70°C
NOTES:
1. Read timing during write and erase are the same as for normal read.
2. Refer to command definition tables for valid address and data values.
3. Sampled, but not 100% tested.
4. Write/Erase durations are measured to valid Status Register (CSR) Data.
5. Byte write operations are typically performed with 1 Programming Pulse.
6. Address and Data are latched on the rising edge of WE
for all Command Write operations.
SYMBOL
PARAMETER
TYP.
MIN.
MAX.
UNITS
NOTE
t
AVAV
Write Cycle Time
120
ns
t
VPWH
V
PP
Set up to WE Going High
100
ns
3
t
PHEL
RP
Setup to CE
Going Low
480
ns
t
ELWL
CE
Setup to WE Going Low
10
ns
t
AVWH
Address Setup to WE Going High
110
ns
2, 6
t
DVWH
Data Setup to WE Going High
110
ns
2, 6
t
WLWH
WE Pulse Width
110
ns
t
WHDX
Data Hold from WE High
5
ns
2
t
WHAX
Address Hold from WE High
5
ns
2
t
WHEH
CE
Hold from WE High
5
ns
t
WHWL
WE Pulse Width High
60
ns
t
GHWL
Read Recovery before Write
0
ns
t
WHRL
WE High to RY
/BY
Going Low
100
ns
t
RHPL
RP
Hold from Valid Status Register
Data and RY
/BY
High
0
ns
3
t
PHWL
RP
High Recovery to WE Going Low
1
μs
t
WHGL
Write Recovery before Read
95
ns
t
QVVL
V
PP
Hold from Valid Status Register
Data and RY
/BY
High
0
μs
t
WHQV1
t
WHQV2
Duration of Byte Write Operation
20
8
μs
4, 5
Duration of Block Erase Operation
0.3
s
4
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