參數(shù)資料
型號(hào): LFEC33E-5T144I
廠商: Lattice Semiconductor Corporation
英文描述: LatticeECP/EC Family Data Sheet
中文描述: LatticeECP / EC的系列數(shù)據(jù)手冊
文件頁數(shù): 35/117頁
文件大?。?/td> 557K
代理商: LFEC33E-5T144I
2-32
Architecture
Lattice Semiconductor
LatticeECP/EC Family Data Sheet
Con
fi
guration and Testing
The following section describes the con
fi
guration and testing features of the LatticeECP/EC family of devices.
IEEE 1149.1-Compliant Boundary Scan Testability
All LatticeECP/EC devices have boundary scan cells that are accessed through an IEEE 1149.1 compliant test
access port (TAP). This allows functional testing of the circuit board, on which the device is mounted, through a
serial scan path that can access all critical logic nodes. Internal registers are linked internally, allowing test data to
be shifted in and loaded directly onto test nodes, or test data to be captured and shifted out for veri
fi
cation. The test
access port consists of dedicated I/Os: TDI, TDO, TCK and TMS. The test access port has its own supply voltage
V
CCJ
and can operate with LVCMOS3.3, 2.5, 1.8, 1.5 and 1.2 standards.
For more details on boundary scan test, please see information regarding additional technical documentation at
the end of this data sheet.
Device Con
fi
guration
All LatticeECP/EC devices contain two possible ports that can be used for device con
fi
guration. The test access
port (TAP), which supports bit-wide con
fi
guration, and the sysCONFIG port that supports both byte-wide and serial
con
fi
guration.
The TAP supports both the IEEE Std. 1149.1 Boundary Scan speci
fi
cation and the IEEE Std. 1532 In-System Con-
fi
guration speci
fi
cation. The sysCONFIG port is a 20-pin interface with six of the I/Os used as dedicated pins and
the rest being dual-use pins. When sysCONFIG mode is not used, these dual-use pins are available for general
purpose I/O. There are four con
fi
guration options for LatticeECP/EC devices:
1.
Industry standard SPI memories.
2.
Industry standard byte wide
fl
ash and ispMACH 4000 for control/addressing.
3.
Con
fi
guration from system microprocessor via the con
fi
guration bus or TAP.
4.
Industry standard FPGA board memory.
On power-up, the FPGA SRAM is ready to be con
fi
gured with the sysCONFIG port active. The IEEE 1149.1 serial
mode can be activated any time after power-up by sending the appropriate command through the TAP port. Once a
con
fi
guration port is selected, that port is locked and another con
fi
guration port cannot be activated until the next
power-up sequence.
For more information on device con
fi
guration, please see details of additional technical documentation at the end
of this data sheet.
Internal Logic Analyzer Capability (ispTRACY)
All LatticeECP/EC devices support an internal logic analyzer diagnostic feature. The diagnostic features provide
capabilities similar to an external logic analyzer, such as programmable event and trigger condition and deep trace
memory. This feature is enabled by Lattice’s ispTRACY. The ispTRACY utility is added into the user design at com-
pile time.
For more information on ispTRACY, please see information regarding additional technical documentation at the
end of this data sheet.
External Resistor
LatticeECP/EC devices require a single external, 10K ohm +/- 1% value between the XRES pin and ground.
Device con
fi
guration will not be completed if this resistor is missing. There is no boundary scan register on the
external resistor pad.
相關(guān)PDF資料
PDF描述
LFEC3E-5F484C LatticeECP/EC Family Data Sheet
LFEC3E-5F484I LatticeECP/EC Family Data Sheet
LFEC3E-5T100C LatticeECP/EC Family Data Sheet
LFEC3E-5T100I LatticeECP/EC Family Data Sheet
LFEC3E-5T144C LatticeECP/EC Family Data Sheet
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