- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄377631 > LFEC20E-4F256I (Lattice Semiconductor Corporation) LatticeECP/EC Family Data Sheet PDF資料下載
參數(shù)資料
| 型號(hào)： | LFEC20E-4F256I |
| 廠商： | Lattice Semiconductor Corporation |
| 英文描述： | LatticeECP/EC Family Data Sheet |
| 中文描述： | LatticeECP / EC的系列數(shù)據(jù)手冊(cè) |
| 文件頁(yè)數(shù)： | 35/117頁(yè) |
| 文件大小： | 557K |
| 代理商： | LFEC20E-4F256I |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)當(dāng)前第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)第77頁(yè)第78頁(yè)第79頁(yè)第80頁(yè)第81頁(yè)第82頁(yè)第83頁(yè)第84頁(yè)第85頁(yè)第86頁(yè)第87頁(yè)第88頁(yè)第89頁(yè)第90頁(yè)第91頁(yè)第92頁(yè)第93頁(yè)第94頁(yè)第95頁(yè)第96頁(yè)第97頁(yè)第98頁(yè)第99頁(yè)第100頁(yè)第101頁(yè)第102頁(yè)第103頁(yè)第104頁(yè)第105頁(yè)第106頁(yè)第107頁(yè)第108頁(yè)第109頁(yè)第110頁(yè)第111頁(yè)第112頁(yè)第113頁(yè)第114頁(yè)第115頁(yè)第116頁(yè)第117頁(yè)
2-32
Architecture
Lattice Semiconductor
LatticeECP/EC Family Data Sheet
Con
fi
guration and Testing
The following section describes the con
fi
guration and testing features of the LatticeECP/EC family of devices.
IEEE 1149.1-Compliant Boundary Scan Testability
All LatticeECP/EC devices have boundary scan cells that are accessed through an IEEE 1149.1 compliant test
access port (TAP). This allows functional testing of the circuit board, on which the device is mounted, through a
serial scan path that can access all critical logic nodes. Internal registers are linked internally, allowing test data to
be shifted in and loaded directly onto test nodes, or test data to be captured and shifted out for veri
fi
cation. The test
access port consists of dedicated I/Os: TDI, TDO, TCK and TMS. The test access port has its own supply voltage
V
CCJ
and can operate with LVCMOS3.3, 2.5, 1.8, 1.5 and 1.2 standards.
For more details on boundary scan test, please see information regarding additional technical documentation at
the end of this data sheet.
Device Con
fi
guration
All LatticeECP/EC devices contain two possible ports that can be used for device con
fi
guration. The test access
port (TAP), which supports bit-wide con
fi
guration, and the sysCONFIG port that supports both byte-wide and serial
con
fi
guration.
The TAP supports both the IEEE Std. 1149.1 Boundary Scan speci
fi
cation and the IEEE Std. 1532 In-System Con-
fi
guration speci
fi
cation. The sysCONFIG port is a 20-pin interface with six of the I/Os used as dedicated pins and
the rest being dual-use pins. When sysCONFIG mode is not used, these dual-use pins are available for general
purpose I/O. There are four con
fi
guration options for LatticeECP/EC devices:
1.
Industry standard SPI memories.
2.
Industry standard byte wide
fl
ash and ispMACH 4000 for control/addressing.
3.
Con
fi
guration from system microprocessor via the con
fi
guration bus or TAP.
4.
Industry standard FPGA board memory.
On power-up, the FPGA SRAM is ready to be con
fi
gured with the sysCONFIG port active. The IEEE 1149.1 serial
mode can be activated any time after power-up by sending the appropriate command through the TAP port. Once a
con
fi
guration port is selected, that port is locked and another con
fi
guration port cannot be activated until the next
power-up sequence.
For more information on device con
fi
guration, please see details of additional technical documentation at the end
of this data sheet.
Internal Logic Analyzer Capability (ispTRACY)
All LatticeECP/EC devices support an internal logic analyzer diagnostic feature. The diagnostic features provide
capabilities similar to an external logic analyzer, such as programmable event and trigger condition and deep trace
memory. This feature is enabled by Lattice’s ispTRACY. The ispTRACY utility is added into the user design at com-
pile time.
For more information on ispTRACY, please see information regarding additional technical documentation at the
end of this data sheet.
External Resistor
LatticeECP/EC devices require a single external, 10K ohm +/- 1% value between the XRES pin and ground.
Device con
fi
guration will not be completed if this resistor is missing. There is no boundary scan register on the
external resistor pad.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| LFEC20E-4F484C | LatticeECP/EC Family Data Sheet |
| LFEC20E-4F484I | LatticeECP/EC Family Data Sheet |
| LFEC20E-4F672C | LatticeECP/EC Family Data Sheet |
| LFEC20E-4F672I | LatticeECP/EC Family Data Sheet |
| LFEC20E-4F900I | LatticeECP/EC Family Data Sheet |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| LFEC20E-4F484C | 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 19.7 LUT 360 I/O RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256 |
| LFEC20E-4F484I | 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 19.7 LUT 360 I/O RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256 |
| LFEC20E-4F672C | 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 19.7 LUT 496 I/O RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256 |
| LFEC20E-4F672I | 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 19.7 LUT 496 I/O RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256 |
| LFEC20E-4F900C | 制造商:LATTICE 制造商全稱:Lattice Semiconductor 功能描述:LatticeECP/EC Family Data Sheet |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。