參數(shù)資料
型號(hào)： LC4064V-25T100C
文件頁(yè)數(shù)： 12/57頁(yè)
文件大?。?/td> 1078K
代理商： LC4064V-25T100C
Lattice Semiconductor
ispMACH 4000V/B/C Family Data Sheet
12
Low Power and Power Management
The ispMACH 4000 family is designed with high speed low power design techniques to offer both high speed and
low power. With an advanced E
low power cell and non sense-ampli
fi
er design approach (full CMOS logic
approach), the ispMACH 4000 family offers SuperFAST pin-to-pin speeds, while simultaneously delivering low
standby power without needing any “turbo bits” or other power management schemes associated with a traditional
sense-ampli
fi
er approach.
2
IEEE 1149.1-Compliant Boundary Scan Testability
All ispMACH 4000 devices have boundary scan cells and are compliant to the IEEE 1149.1 standard. This allows
functional testing of the circuit board on which the device is mounted through a serial scan path that can access all
critical logic notes. Internal registers are linked internally, allowing test data to be shifted in and loaded directly onto
test nodes, or test node data to be captured and shifted out for veri
fi
cation. In addition, these devices can be linked
into a board-level serial scan path for more board-level testing. The test access port operates with an LVCMOS
interface that corresponds to the power supply voltage.
I/O Quick Con
fi
guration
To facilitate the most ef
fi
cient board test, the physical nature of the I/O cells must be set before running any continu-
ity tests. As these tests are fast, by nature, the overhead and time that is required for con
fi
guration of the I/Os’
physical nature should be minimal so that board test time is minimized. The ispMACH 4000 family of devices allows
this by offering the user the ability to quickly con
fi
gure the physical nature of the I/O cells. This quick con
fi
guration
takes milliseconds to complete, whereas it takes seconds for the entire device to be programmed. Lattice's
ispVM System programming software can either perform the quick con
fi
guration through the PC parallel port, or
can generate the ATE or test vectors necessary for a third-party test system.
IEEE 1532-Compliant In-System Programming
Programming devices in-system provides a number of signi
fi
cant bene
fi
ts including: rapid prototyping, lower inven-
tory levels, higher quality and the ability to make in-
fi
eld modi
fi
cations. All ispMACH 4000 devices provide In-Sys-
tem Programming (ISP) capability through the Boundary Scan Test Access Port. This capability has been
implemented in a manner that ensures that the port remains complaint to the IEEE 1149.1 standard. By using IEEE
1149.1 as the communication interface through which ISP is achieved, users get the bene
fi
t of a standard, well-
de
fi
ned interface. All ispMACH 4000 devices are also compliant with the IEEE 1532 standard.
The ispMACH 4000 devices can be programmed across the commercial temperature and voltage range. The PC-
based Lattice software facilitates in-system programming of ispMACH 4000 devices. The software takes the
JEDEC
fi
le output produced by the design implementation software, along with information about the scan chain,
and creates a set of vectors used to drive the scan chain. The software can use these vectors to drive a scan chain
via the parallel port of a PC. Alternatively, the software can output
fi
les in formats understood by common auto-
mated test equipment. This equipment can then be used to program ispMACH 4000 devices during the testing of a
circuit board.
Security Bit
A programmable security bit is provided on the ispMACH 4000 devices as a deterrent to unauthorized copying of
the array con
fi
guration patterns. Once programmed, this bit defeats readback of the programmed pattern by a
device programmer, securing proprietary designs from competitors. Programming and veri
fi
cation are also
defeated by the security bit. The bit can only be reset by erasing the entire device.
Hot Socketing
The ispMACH 4000 devices are well-suited for applications that require hot socketing capability. Hot socketing a
device requires that the device, during power-up and down, can tolerate active signals on the I/Os and inputs with-
out being damaged. Additionally, it requires that the effects of I/O pin loading be minimal on active signals.
相關(guān)PDF資料
PDF描述
LC4064V-5T100C
LC4064V-5T100I
LC4064V-75T100C
LC4064V-75T100I
LC4128C-5T100I
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
LC4064V-25T44C 功能描述:CPLD - 復(fù)雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲(chǔ)類型:EEPROM 大電池?cái)?shù)量:128 最大工作頻率:333 MHz 延遲時(shí)間:2.7 ns 可編程輸入/輸出端數(shù)量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4064V-25T48C 功能描述:CPLD - 復(fù)雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲(chǔ)類型:EEPROM 大電池?cái)?shù)量:128 最大工作頻率:333 MHz 延遲時(shí)間:2.7 ns 可編程輸入/輸出端數(shù)量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4064V-25TN100C 功能描述:CPLD - 復(fù)雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲(chǔ)類型:EEPROM 大電池?cái)?shù)量:128 最大工作頻率:333 MHz 延遲時(shí)間:2.7 ns 可編程輸入/輸出端數(shù)量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4064V-25TN44C 功能描述:CPLD - 復(fù)雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲(chǔ)類型:EEPROM 大電池?cái)?shù)量:128 最大工作頻率:333 MHz 延遲時(shí)間:2.7 ns 可編程輸入/輸出端數(shù)量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
LC4064V-25TN48C 功能描述:CPLD - 復(fù)雜可編程邏輯器件 PROGRAMMABLE SUPER FAST HI DENSITY PLD RoHS:否 制造商:Lattice 系列: 存儲(chǔ)類型:EEPROM 大電池?cái)?shù)量:128 最大工作頻率:333 MHz 延遲時(shí)間:2.7 ns 可編程輸入/輸出端數(shù)量:64 工作電源電壓:3.3 V 最大工作溫度:+ 90 C 最小工作溫度:0 C 封裝 / 箱體:TQFP-100
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*