參數(shù)資料
型號: KM48V8004B
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 8M x 8bit CMOS Dynamic RAM with Extended Data Out
中文描述: 8米× 8位的CMOS動態(tài)隨機存儲器的擴展數(shù)據(jù)輸出
文件頁數(shù): 5/21頁
文件大?。?/td> 386K
代理商: KM48V8004B
KM48V8004B,
KM48V8104B
CMOS DRAM
CAPACITANCE
(T
A
=25
°
C, V
CC
=3.3V, f=1MHz)
Parameter
Symbol
Min
Max
Units
Input capacitance [A0 ~ A12]
C
IN1
-
5
pF
Input capacitance [RAS, CAS, W, OE]
C
IN2
-
7
pF
Output capacitance [DQ0 - DQ7]
C
DQ
-
7
pF
AC CHARACTERISTICS
(0
°
C
T
A
70
°
C, See note 1,2)
Test condition : V
CC
=3.3V
±
0.3V, Vih/Vil=2.2/0.7V, Voh/Vol=2.0/0.8V
Parameter
Symbol
-45
-5
-6
Units
Note
Min
Max
Min
Max
Min
Max
Random read or write cycle time
t
RC
t
RWC
t
RAC
t
CAC
t
AA
t
CLZ
t
CEZ
t
OLZ
t
T
t
RP
74
84
104
ns
Read-modify-write cycle time
101
113
138
ns
Access time from RAS
45
50
60
ns
3,4,10
Access time from CAS
12
13
15
ns
3,4,5
Access time from column address
23
25
30
ns
3,10
CAS to output in Low-Z
3
3
3
ns
3
Output buffer turn-off delay from CAS
3
13
3
13
3
13
ns
6,14
OE to output in Low-Z
3
3
3
ns
3
Transition time (rise and fall)
1
50
1
50
1
50
ns
2
RAS precharge time
25
30
40
ns
RAS pulse width
t
RAS
t
RSH
t
CSH
t
CAS
t
RCD
t
RAD
t
CRP
t
ASR
t
RAH
t
ASC
t
CAH
t
RAL
45
10K
50
10K
60
10K
ns
RAS hold time
8
8
10
ns
CAS hold time
35
38
40
ns
CAS pulse width
7
5K
8
10K
10
10K
ns
RAS to CAS delay time
11
33
11
37
14
45
ns
4
RAS to column address delay time
9
22
9
25
12
30
ns
10
CAS to RAS precharge time
5
5
5
ns
Row address set-up time
0
0
0
ns
Row address hold time
7
7
10
ns
Column address set-up time
0
0
0
ns
Column address hold time
7
7
10
ns
Column address to RAS lead time
23
25
30
ns
Read command set-up time
t
RCS
t
RCH
t
RRH
t
WCH
t
WP
t
RWL
t
CWL
t
DS
0
0
0
ns
Read command hold time referenced to CAS
0
0
0
ns
8
Read command hold time referenced to RAS
0
0
0
ns
8
Write command hold time
7
7
10
ns
Write command pulse width
6
7
10
ns
Write command to RAS lead time
8
8
10
ns
Write command to CAS lead time
7
7
10
ns
Data set-up time
0
0
0
ns
9
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