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參數(shù)資料
| 型號(hào)： | JM4050ABEA |
| 英文描述： | Buffer/Driver |
| 中文描述： | 緩沖器/驅(qū)動(dòng)器 |
| 文件頁(yè)數(shù)： | 4/6頁(yè) |
| 文件大?。?/td> | 17K |
| 代理商： | JM4050ABEA |
MJCD4050A-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS(Continued)
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
VOL4
Output Low
Voltage
VDD=12.5V, VIL=2.8V, IOL=0.0mA
1, 2 OUTPUTS
1.25
V
1
VDD=12.5V, VIL=2.55V, IOL=0.0mA
1, 2 OUTPUTS
1.25
V
2
VDD=12.5V, VIL=3.05V, IOL=0.0mA
1, 2 OUTPUTS
1.25
V
3
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
VDD=5.0V, CL=50pF, RL=200K Ohms to ground, Tr/Tf=10nS
tpHL
Propagation Delay
Time
7, 8 In to
On
6
150
nS
9, 11
7, 8 In to
On
9
225
nS
10
tpLH
Propagation Delay
Time
7, 8 In to
On
6
230
nS
9, 11
7, 8 In to
On
9
345
nS
10
tTHL
Transition Time
7, 8 On
6
70
nS
9, 11
7, 8 On
9
105
nS
10
tTLH
Transition Time
7, 8 On
6
270
nS
9, 11
7, 8 On
9
405
nS
10
Cin
Input Capacitance
VDD=Gnd, f=1MHz
10
INPUTS
12
pF
4
DC PARAMETERS: DRIFT VALUES
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
Delta calculations performed at production burn-in and Group C (operational life test).
ISS
Power Supply
Current
VDD=15.0V, VIN=15.0V or VIN=0.0V,
VM=0.0V
12
VSS
-20.0
20.0
nA
1
VDD=15.0V, VIN=0.0V, VM=0.0V
12
VSS
-20.0
20.0
nA
1
VOL1
Output Low
Voltage
VDD=5.5V, VIL=1.1V, IOL=0.23ma
12
OUTPUTS -0.04
0.04
V
1
VOH1
Output High
Voltage
VDD=4.5V, VIL=3.8V, IOH=-0.10ma
12
OUTPUTS -0.08
0.08
V
1
Note 1:
Screen tested 100% on each device at +25C, +125C and -55C temperature, subgroups A1,
2 and 3.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C
temperature, subgroups A1, 2 and 3.
Screen tested 100% on each device at +25C and +125C temperature only, subgroup A1 and
2.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C and +125C temperature
only, subgroup A1 and 2.
Screen tested 100% on each device at +25C temperature only, subgroup A1.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature only,
subgroup A1.
Screen tested 100% on each device at +25C temperature only, subgroup A9.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
4
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