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參數(shù)資料
| 型號： | JANTX2N6661 |
| 英文描述： | TRANSISTOR | MOSFET | N-CHANNEL | 90V V(BR)DSS | 2A I(D) | TO-39 |
| 中文描述： | 晶體管| MOSFET的| N溝道| 90V的五（巴西）直|甲（?。﹟ TO - 39封裝 |
| 文件頁數(shù)： | 2/21頁 |
| 文件大?。?/td> | 137K |
| 代理商： | JANTX2N6661 |
MIL-PRF-19500/368F
10
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of
screened devices shall be submitted to and pass the requirements of group A1 and A2 inspection only (table VIb,
group B, subgroup 1 is not required to be performed again if group B has already been satisfied in accordance with
4.4.2).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in VIa (JANS) of 4.4.2.1 herein. Electrical measurements (end-points) requirements shall be in
accordance with table I, group A, subgroup 2 herein. Delta requirements shall be in accordance with 4.5.3 herein.
See 4.4.2.2 herein for JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points)
requirements shall be in accordance with table I, group A, subgroup 2 herein. Delta requirements shall be in
accordance with 4.5.3 herein.
* 4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
B4
1037
V
CB
= 10 V dc, 2,000 cycles.
B5
1027
V
CB
= 10-30 V dc; PD
≥ 100 percent of maximum rated PT (see 1.3).
(NOTE: If a failure occurs, resubmission shall be at the test conditions of the
original sample.)
Option 1: 96 hrs min, sample size in accordance with table Via of
MIL-PRF-19500, adjust TA or PD to achieve TJ = +275
°C minimum.
Option 2: 216 hrs min., sample size = 45, c = 0; adjust TA or PD to achieve
TJ = +225
°C minimum.
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