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參數(shù)資料
| 型號： | JANSR2N7262U |
| 英文描述： | 200V 100kRad Hi-Rel Single N-Channel TID Hardened MOSFET in a 18-pin LCC package |
| 中文描述： | 200伏100kRad高可靠性單個(gè)N -溝道工貿(mào)署在18硬化MOSFET的引腳LCC封裝 |
| 文件頁數(shù)： | 8/12頁 |
| 文件大小： | 269K |
| 代理商： | JANSR2N7262U |
www.irf.com
5
Pre-Irradiation
IRHE7230, JANSR2N7262U
Post-Irradiation
Fig 6. Typical On-State Resistance Vs.
Neutron Fluence Level
Fig 5. Typical Zero Gate Voltage Drain
Current Vs. Total Dose Exposure
Fig 8b. VDSS Stress Equals
80% of BVDSS During Radiation
Fig 9. High Dose Rate
(Gamma Dot) Test Circuit
Fig 7. Typical Transient Response
of Rad Hard HEXFET During
1x1012 Rad (Si)/Sec Exposure
Fig 8a. Gate Stress of VGSS
Equals 12 Volts During
Radiation
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