Specifications ispLSI 2128/A
4
USE
ispLSI
2128E
FOR
NEW
DESIGNS
Switching Test Conditions
Figure 2. Test Load
+ 5V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
0213A
Input Pulse Levels
Table 2 - 0003/2000
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
≤ 3ns 10% to 90%
1.5V
See Figure 2
3-state levels are measured 0.5V from steady-state
active level.
DC Electrical Characteristics
Over Recommended Operating Conditions
TEST CONDITION
R1
R2
CL
A
470Ω
390Ω
35pF
B
∞
390Ω
35pF
470Ω
390Ω
35pF
Active High
Active Low
C
470Ω
390Ω
5pF
∞
390Ω
5pF
Active Low to Z
at V
+0.5V
OL
Active High to Z
at V
-0.5V
OH
Table 2 - 0004A/2000
Output Load Conditions (see Figure 2)
VOL
SYMBOL
1. One output at a time for a maximum duration of one second. V
= 0.5V was selected to avoid test problems
by tester ground degradation. Characterized but not 100% tested.
2. Measured using eight 16-bit counters.
3. Typical values are at V = 5V and T = 25°C.
4. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and the Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM
to estimate maximum I
.
Table 2-0007/2128
1
VOH
IIH
IIL
IIL-isp
PARAMETER
IIL-PU
IOS
2, 4
ICC
Output Low Voltage
Output High Voltage
Input or I/O High Leakage Current
Input or I/O Low Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
I = 8 mA
I
= -4 mA
3.5V ≤ V ≤ V
0V ≤ V ≤ V (Max.)
0V ≤ V ≤ V
V = 5V, V
= 0.5V
V = 0.0V, V = 3.0V
f
= 1 MHz
OL
OH
IN
IL
IN
CC
IN
IL
IN
IL
CC
OUT
CLOCK
IL
IH
CONDITION
MIN.
TYP.
MAX.
UNITS
3
–
2.4
–
0.4
–
10
-10
-150
-200
V
μA
mA
CC
A
OUT
165
325
CC
Commercial
Industrial
–mA
165
–
Select
devices
have
been
discontinued.
See
Ordering
Information
section
for
product
status.