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參數(shù)資料
| 型號： | ISL4243EIRZ-T |
| 廠商： | Intersil |
| 文件頁數(shù)： | 4/14頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC XMITTER/RCVR ESD RS232 32-QFN |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 類型： | 收發(fā)器 |
| 驅(qū)動器/接收器數(shù)： | 3/5 |
| 規(guī)程： | RS232 |
| 電源電壓： | 2.7 V ~ 5.5 V |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 32-VFQFN 裸露焊盤 |
| 供應(yīng)商設(shè)備封裝： | 32-QFN 裸露焊盤（5x5） |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 其它名稱： | ISL4243EIRZ-TDKR |
12
FN8037.7
June 10, 2010
±15kV ESD Protection
All pins on ISL4241E, ISL4243E devices include ESD
protection structures, but the RS-232 pins (transmitter
outputs and receiver inputs) incorporate advanced
structures which allow them to survive ESD events up to
±15kV. The RS-232 pins are particularly vulnerable to ESD
damage because they typically connect to an exposed port
on the exterior of the finished product. Simply touching the
port pins, or connecting a cable, can cause an ESD event
that might destroy unprotected ICs. These new ESD
structures protect the device whether or not it is powered up,
protect without allowing any latchup mechanism to activate,
and don’t interfere with RS-232 signals as large as ±25V.
Human Body Model (HBM) Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge through a 1.5k
Ω current limiting resistor,
making the test less severe than the IEC61000 test which
utilizes a 330
Ω limiting resistor. The HBM method
determines an ICs ability to withstand the ESD transients
typically present during handling and manufacturing. Due to
the random nature of these events, each pin is tested with
respect to all other pins. The RS-232 pins on “E” family
devices can withstand HBM ESD events to
±15kV.
IEC61000-4-2 Testing
The IEC61000 test method applies to finished equipment,
rather than to an individual IC. Therefore, the pins most likely
to suffer an ESD event are those that are exposed to the
outside world (the RS-232 pins in this case), and the IC is
tested in its typical application configuration (power applied)
rather than testing each pin-to-pin combination. The lower
current limiting resistor coupled with the larger charge
storage capacitor yields a test that is much more severe than
the HBM test. The extra ESD protection built into this
device’s RS-232 pins allows the design of equipment
meeting level 4 criteria without the need for additional board
level protection on the RS-232 port.
AIR-GAP DISCHARGE TEST METHOD
For this test method, a charged probe tip moves toward the
IC pin until the voltage arcs to it. The current waveform
delivered to the IC pin depends on approach speed,
humidity, temperature, etc., so it is difficult to obtain
repeatable results. The “E” device RS-232 pins withstand
±15kV air-gap discharges.
CONTACT DISCHARGE TEST METHOD
During the contact discharge test, the probe contacts the
tested pin before the probe tip is energized, thereby
eliminating the variables associated with the air-gap
discharge. The result is a more repeatable and predictable
test, but equipment limits prevent testing devices at voltages
higher than
±8kV. All “E” family devices survive ±8kV contact
discharges on the RS-232 pins.
5
3.3
Compatible with ACT and HCT
CMOS, and with TTL. ISL4241E,
ISL4243E outputs are
incompatible with AC, HC, and
CD4000 CMOS inputs.
TABLE 3.
LOGIC FAMILY COMPATIBILITY WITH VARIOUS
SUPPLY VOLTAGES (Continued)
SYSTEM
POWER-SUPPLY
VOLTAGE
(V)
VCC
SUPPLY
VOLTAGE
(V)
COMPATIBILITY
Typical Performance Curves VCC = 3.3V, TA = +25°C
FIGURE 12. TRANSMITTER OUTPUT VOLTAGE vs LOAD
CAPACITANCE
FIGURE 13. SLEW RATE vs LOAD CAPACITANCE
-6
-4
-2
0
2
4
6
1000
2000
3000
4000
5000
0
LOAD CAPACITANCE (pF)
TRANSMITT
E
R
OUT
P
UT
VOLT
AGE
(V)
1 TRANSMITTER AT 250kbps
VOUT+
VOUT -
OTHER TRANSMITTERS AT 30kbps
LOAD CAPACITANCE (pF)
SLEW
RA
TE
(V
/μ
s)
0
1000
2000
3000
4000
5000
5
10
15
20
25
+SLEW
-SLEW
ISL4241E, ISL4243E
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ISL4244E | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:QFN Packaged, ±15kV ESD Protected, +2.7V to +5.5V, 10Nanoamp, 250kbps/1Mbps, RS-232 Transceivers with Enhanced Automatic Power-down |
| ISL4244EIR | 功能描述:IC 3DRVR/5RCVR RS232 3V 32-QFN RoHS:否 類別:集成電路 (IC) >> 接口 - 驅(qū)動器，接收器，收發(fā)器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:25 系列:- 類型:收發(fā)器 驅(qū)動器/接收器數(shù):2/2 規(guī)程:RS232 電源電壓:4.5 V ~ 5.5 V 安裝類型:通孔 封裝/外殼:16-DIP（0.300"，7.62mm） 供應(yīng)商設(shè)備封裝:16-PDIP 包裝:管件 |
| ISL4244EIR-T | 功能描述:IC 3DRVR/5RCVR RS232 3V 32-QFN RoHS:否 類別:集成電路 (IC) >> 接口 - 驅(qū)動器，接收器，收發(fā)器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:25 系列:- 類型:收發(fā)器 驅(qū)動器/接收器數(shù):2/2 規(guī)程:RS232 電源電壓:4.5 V ~ 5.5 V 安裝類型:通孔 封裝/外殼:16-DIP（0.300"，7.62mm） 供應(yīng)商設(shè)備封裝:16-PDIP 包裝:管件 |
| ISL4244EIRZ | 功能描述:IC TXRX RS232 2.7-5.5V 32QFN RoHS:是 類別:集成電路 (IC) >> 接口 - 驅(qū)動器，接收器，收發(fā)器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:2,500 系列:- 類型:發(fā)射器 驅(qū)動器/接收器數(shù):4/0 規(guī)程:RS422，RS485 電源電壓:4.75 V ~ 5.25 V 安裝類型:表面貼裝 封裝/外殼:16-SOIC（0.154"，3.90mm 寬） 供應(yīng)商設(shè)備封裝:16-SOIC 包裝:帶卷 (TR) |
| ISL4244EIRZ-T | 功能描述:IC 3DRVR/5RCVR RS232 3V 32-QFN RoHS:是 類別:集成電路 (IC) >> 接口 - 驅(qū)動器，接收器，收發(fā)器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:2,500 系列:- 類型:發(fā)射器 驅(qū)動器/接收器數(shù):4/0 規(guī)程:RS422，RS485 電源電壓:4.75 V ~ 5.25 V 安裝類型:表面貼裝 封裝/外殼:16-SOIC（0.154"，3.90mm 寬） 供應(yīng)商設(shè)備封裝:16-SOIC 包裝:帶卷 (TR) |
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