IRKU/V105 Series
3
Bulletin I27136 rev. B 09/97
www.irf.com
T
J
Junction operating temperature
range
T
stg
Storage temperature range
- 40 to 125
R
thJC
Max. internal thermal resistance,
0.135
Per module, DC operation
junction to case
R
thCS
Typical thermal resistance
case to heatsink
T
Mounting torque ± 10%
to heatsink
5
busbar
3
wt
Approximate weight
83 (3)
g (oz)
Case style
TO-240AA
JEDEC
Thermal and Mechanical Specifications
Parameters
IRKU/V105
Units
Conditions
- 40 to 130
0.1
(5) Available with dv/dt = 1000V/
s, to complete code add S90 i.e. IRKU105/16S90.
A mounting compound is recommended
and the torque should be rechecked after
a period of 3 hours to allow for the
spread of the compound
°C
K/W
Nm
Mounting surface flat, smooth and greased.
Flatness < 0.03 mm; roughness
< 0.02 mm
I
RRM
Max. peak reverse and
I
DRM
off-state leakage current
20
mA
T
J
= 130oC, gate open circuit
at VRRM, VDRM
V
INS
RMS isolation voltage
2500 (1 min)
50 Hz, circuit to base, all terminals
3500 (1 sec)
shorted
dv/dt Max. critical rate of rise
T
J
= 130oC, linear to 0.67 V
DRM,
of off-state voltage (5)
gate open circuit
Triggering
P
GM
Max. peak gate power
12
P
G(AV) Max. average gate power
3
I
GM
Max. peak gate current
3
A
-V
GM
Max. peak negative gate voltage
10
V
GT
Max. gate voltage
4.0
V
TJ= - 40°C
required to trigger
2.5
TJ= 25°C
1.7
TJ= 125°C
I
GT
Max. gate current
270
TJ= - 40°C
required to trigger
150
mA
TJ= 25°C
80
TJ = 125°C
V
GD
Max. gate voltage
that will not trigger
I
GD
Max. gate current
that will not trigger
0.25
V
6mA
Anode supply = 6V
resistive load
Anode supply = 6V
resistive load
W
T
J = 125
oC,
rated V
DRM applied
T
J = 125
oC,
rated V
DRM applied
Parameters
IRK.U/V105
Units
Conditions
Parameters
IRKU/V 105
Units
Conditions
Blocking
V
500
V/
s
Sine half wave conduction
Rect. wave conduction
Devices
Units
180o
120o
90o
60o
30o
180o
120o
90o
60o
30o
IRKU/V105
0.04
0.05
0.06
0.08
0.12
0.03
0.05
0.06
0.08
0.12
°C/W
R Conduction (per Junction)
(The following table shows the increment of thermal resistance R
thJC
when devices operate at different conduction angles than DC)