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參數(shù)資料
| 型號： | INA2137UAE4 |
| 廠商： | Texas Instruments |
| 文件頁數(shù)： | 8/14頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC AUDIO DIFF LINE RCVR 14SOIC |
| 標準包裝： | 50 |
| 類型： | 線路接收器 |
| 應(yīng)用： | 分流監(jiān)控器 |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 14-SOIC（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 14-SOIC |
| 包裝： | 管件 |
3
INA137, INA2137
PIN CONFIGURATIONS
Top View
8-Pin DIP/SO-8
Top View
14-Pin DIP/SO-14
Ref
–In
+In
V–
NC
V+
Output
Sense
NC = No Connection
1
2
3
4
8
7
6
5
Supply Voltage, V+ to V– .................................................................... 40V
Input Voltage Range ..........................................................................
±80V
Output Short-Circuit (to ground)(2) ............................................................ Continuous
Operating Temperature ................................................. –55
°C to +125°C
Storage Temperature ..................................................... –55
°C to +125°C
Junction Temperature .................................................................... +150
°C
Lead Temperature (soldering, 10s) ............................................... +300
°C
NOTE: (1) Stresses above these ratings may cause permanent damage.
(2) One channel per package.
ABSOLUTE MAXIMUM RATINGS(1)
PACKAGE/ORDERING INFORMATION
PACKAGE
SPECIFICATION
DRAWING
TEMPERATURE
PRODUCT
PACKAGE
NUMBER(1)
RANGE
Single
INA137PA
8-Pin DIP
006
–40
°C to +85°C
INA137UA
SO-8 Surface-Mount
182
–40
°C to +85°C
Dual
INA2137PA
14-Pin DIP
010
–40
°C to +85°C
INA2137UA
SO-14 Surface-Mount
235
–40
°C to +85°C
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with ap-
propriate precautions. Failure to observe proper handling and
installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
NC
–In A
+In A
V–
+In B
–In B
NC
Ref A
Out A
Sense A
V+
Sense B
Out B
Ref B
NC = No Connection
1
2
3
4
5
6
7
14
13
12
11
10
9
8
A
B
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