參數(shù)資料
型號： IDT79R3052E-25J8
廠商： INTEGRATED DEVICE TECHNOLOGY INC
元件分類： 微控制器/微處理器
英文描述： 32-BIT, 25 MHz, RISC PROCESSOR, PQCC84
封裝： PLASTIC, LCC-84
文件頁數(shù)： 3/26頁
文件大?。?/td> 431K
代理商： IDT79R3052E-25J8
5.3
11
IDT79R3051/79R3052 INTEGRATED RISControllers
COMMERCIAL TEMPERATURE RANGE
RECOMMENDED OPERATING
TEMPERATURE AND SUPPLY VOLTAGE
OUTPUT LOADING FOR AC TESTING
ABSOLUTE MAXIMUM RATINGS
(1, 3)
Symbol
Rating
Commercial
Unit
VTERM
Terminal Voltage
–0.5 to +7.0
V
with Respect
to GND
TC
Operating Case
0 to +85
°C
Temperature
TBIAS
Temperature
–55 to +125
°C
Under Bias
TSTG
Storage
–55 to +125
°C
Temperature
VIN
Input Voltage
–0.5 to +7.0
V
NOTES:
2874 tbl 04
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2. VIN minimum = –3.0V for pulse width less than 15ns.
VIN should not exceed VCC +0.5V.
3. Not more than one output should be shorted at a time. Duration of the short
should not exceed 30 seconds.
Symbol
Parameter
Min.
Max.
Unit
VIH
Input HIGH Voltage
3.0
—
V
VIL
Input LOW Voltage
—
0
V
VIHS
Input HIGH Voltage
3.5
—
V
VILS
Input LOW Voltage
—
0
V
AC TEST CONDITIONS
2874 tbl 05
Grade
Temperature
GND
VCC
Commercial
0
°C to +85°C
0V
5.0
±5%
(Case)
2874 tbl 06
DC ELECTRICAL CHARACTERISTICS (TC = 0
°C to +85°C, VCC = +5.0V ±5%)
NOTES:
1. VIL Min. = –3.0V for pulse width less than 15ns. VIL should not fall below –0.5V for larger periods.
2. VIHS and VILS apply to CIk2xIn and
Reset.
3. VIH should not be held above VCC + 0.5V.
4. Guaranteed by design.
20MHz
25MHz
33.33MHz
40MHz
Symbol
Parameter
Test Conditions
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max. Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = –4mA
3.5
—
3.5
—
3.5
—
3.5
—
V
VOL
Output LOW Voltage
VCC = Min., IOL = 4mA
—
0.4
—
0.4
—
0.4
—
0.4
V
VIH
Input HIGH Voltage(3)
—
2.0
—
2.0
—
2.0
—
2.0
—
V
VIL
Input LOW Voltage(1)
—
0.8
—
0.8
—
0.8
—
0.8
V
VIHS
Input HIGH Voltage(2,3)
—
3.0
—
3.0
—
3.0
—
3.0
—
V
VILS
Input LOW Voltage(1,2)
—
0.4
—
0.4
—
0.4
—
0.4
V
CIN
Input Capacitance(4)
—
10
—
10
—
10
—
10
pF
COUT
Output Capacitance(4)
—
10
—
10
—
10
—
10
pF
ICC
Operating Current
VCC = 5V, TC = 25
°C
—
350
—
400
—
450
—
500
mA
IIH
Input HIGH Leakage
VIH = VCC
—
100
—
100
—
100
—
100
A
IIL
Input LOW Leakage
VIL = GND
–100
—
–100
—
–100
—
–100
—
A
IOZ
Output Tri-state Leakage
VOH = 2.4V, VOL = 0.5V
–100
100
–100
100
–100
100
–100
100
A
2874 tbl 07
–
+
To Device
Under Test
25pF
–4mA
+4mA
VREF
+1.5V
2874 drw 08
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