參數(shù)資料
型號: IDT74SSTU32866BBFG8
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: 鎖存器
英文描述: SSTU SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, PBGA96
封裝: GREEN, LFBGA-96
文件頁數(shù): 2/19頁
文件大小: 300K
代理商: IDT74SSTU32866BBFG8
10
COMMERCIALTEMPERATURERANGE
IDT74SSTU32866B
1.8VCONFIGURABLEREGISTEREDBUFFERWITHADDRESS-PARITYTEST
TERMINAL FUNCTIONS (ALL PINS)
Terminal
Electrical
Name
Characteristics
Description
GND
GroundInput
Ground
VDD
1.8Vnominal
Power Supply Voltage
VREF
0.9Vnominal
InputReferenceVoltage
CLK
DifferentialInput
Positive Master Clock Input
CLK
DifferentialInput
Negative Master Clock Input
C x
LVCMOS Input
ConfigurationControlInputs
RESET
LVCMOS Input
AsynchronousResetInput. ResetsregistersanddisablesVREFdataandclockdifferential-inputreceivers.
CSR, DCS
SSTL_18Input
Chip Select Inputs. Disables outputs Dx switching when both inputs are HIGH.
Dx
SSTL_18Input
Data Input. Clocked in on the crossing of the rising edge of CLK and the falling edge of CLK.
DODT
SSTL_18Input
The outputs of this register bit will not be suspended by the DCS and CSR controls
DCKE
SSTL_18Input
The outputs of this register bit will not be suspended by the DCS and CSR controls
Qx
1.8V CMOS
Data Outputs that are suspended by the DCS andCSR controls
QCSx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
QODTx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
QCKEx
1.8V CMOS
Data Output that will not be suspended by the DCS and CSR controls
PAR_IN
SSTL_18Input
Parity Input. Clocked on the rising edge of CLK one cycle after corresponding data input.
QERR
OpenDrainOutput
OutputErrorbit,generatedonecycleafterthecorrespondingdataoutput
PPO
1.8V CMOS
Partial Parity Output. Indicates ODD parity of Data Inputs and Parity In.
ABSOLUTE MAXIMUM RATINGS (1)
Symbol
Description
Max.
Unit
VDD
SupplyVoltageRange
–0.5 to 2.5
V
VI(2,3)
InputVoltageRange
–0.5 to 2.5
V
VO(2,3)
OutputVoltageRange
–0.5 to VDD +0.5
V
IIK
InputClampCurrent
VI < 0
±50
mA
VI > VDD
IOK
OutputClampCurrent VO < 0
±50
mA
VO > VDD
IO
ContinuousOutputCurrent,
±50
mA
VO = 0 to VDD
VDD
ContinuousCurrentthrougheach
±100
mA
VDD or GND
TSTG
StorageTemperatureRange
–65to+150
°C
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. The input and output negative voltage ratings may be exceeded if the ratings of the
I/P and O/P clamp current are observed.
3. This value is limited to 2.5V maximum.
MODE SELECT
C0
C1
Device Mode
0
1:125-bitto25-bit
0
1
1:2 14-bit to 28-bit, Front (Type A)
1
0
Reserved
1
1:2 14-bit to 28-bit, Back (Type B)
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