4
INDUSTRIALTEMPERATURERANGE
IDT74FCT163827A/C
3.3V CMOS 20-BIT BUFFER
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
Quiescent Power Supply Current
VCC = Max.
—
2
30
A
TTL Inputs HIGH
VIN = VCC - 0.6V(3)
ICCD
Dynamic Power Supply
VCC = Max.
VIN = VCC
—
50
75
A/
Current(4)
Outputs Open
VIN = GND
MHz
x
OE1 = xOE2 = GND
One Input Togging
50% Duty Cycle
IC
Total Power Supply Current(6)
VCC = Max.,Outputs Open
VIN = VCC
—
0.5
0.7
mA
fI = 10MHz
VIN = GND
50% Duty Cycle
x
OE1 = xOE2 = GND
VIN = VCC - 0.6V
—
0.5
0.8
One Bit Toggling
VIN = GND
VCC = Max.,Outputs Open
VIN = VCC
—
2.5
3.7(5)
fI = 2.5MHz
VIN = GND
50% Duty Cycle
x
OE1 = xOE2 = GND
VIN = VCC - 0.6V
—
2.5
4.1(5)
Twenty Bits Toggling
VIN = GND
POWER SUPPLY CHARACTERISTICS
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, +25°C ambient.
3. Per TTL driven input. All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC +
ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi