參數(shù)資料
    型號: IDT71V2556S166BQ
    廠商: INTEGRATED DEVICE TECHNOLOGY INC
    元件分類: DRAM
    英文描述: 128K x 36, 256K x 18 3.3V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
    中文描述: 128K X 36 ZBT SRAM, 3.5 ns, PBGA165
    封裝: 13 X 15 MM, FBGA-165
    文件頁數(shù): 1/28頁
    文件大?。?/td> 1019K
    代理商: IDT71V2556S166BQ
    OCTOBER 2004
    DSC-4875/08
    1
    2004 Integrated Device Technology, Inc.
    Pin Description Summary
    A
    0
    -A
    17
    Description
    The IDT71V2556/58 are 3.3V high-speed 4,718,592-bit (4.5 Mega-
    bit) synchronous SRAMS. They are designed to elimnate dead bus cycles
    when turning the bus around between reads and writes, or writes and
    reads. Thus, they have been given the name ZBT
    TM
    , or Zero Bus
    Turnaround.
    Address and control signals are applied to the SRAMduring one clock
    Features
    N
    128K x 36, 256K x 18 memory configurations
    N
    Supports high performance system speed - 200 MHz
    (3.2 ns Clock-to-Data Access)
    N
    ZBT
    TM
    Feature - No dead cycles between write and read
    cycles
    N
    Internally synchronized output buffer enable eliminates the
    need to control
    OE
    N
    Single R/
    W
    (READ/WRITE) control pin
    N
    Positive clock-edge triggered address, data, and control
    signal registers for fully pipelined applications
    N
    4-word burst capability (interleaved or linear)
    N
    Individual byte write (
    BW
    1
    -
    BW
    4
    ) control (May tie active)
    N
    Three chip enables for simple depth expansion
    N
    3.3V power supply (±5%), 2.5V I/O Supply (V
    DDQ)
    N
    Optional - Boundary Scan JTAG Interface (IEEE 1149.1
    complaint)
    N
    Packaged in a JEDEC standard 100-pin plastic thin quad
    flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch
    ball grid array (fBGA)
    Address Inputs
    Input
    Synchronous
    CE
    1
    , CE
    2
    ,
    CE
    2
    Chip Enables
    Input
    Synchronous
    OE
    Output Enable
    Input
    Asynchronous
    R/
    W
    Read/Write Signal
    Input
    Synchronous
    CEN
    Clock Enable
    Input
    Synchronous
    BW
    1
    ,
    BW
    2
    ,
    BW
    3
    ,
    BW
    4
    Individual Byte Write Selects
    Input
    Synchronous
    CLK
    Clock
    Input
    N/A
    ADV/
    LD
    Advance burst address / Load new address
    Input
    Synchronous
    LBO
    Linear / Interleaved Burst Order
    Input
    Static
    TMS
    Test Mode Select
    Input
    Synchronous
    TDI
    Test Data Input
    Input
    Synchronous
    TCK
    Test Clock
    Input
    N/A
    TDO
    Test Data Output
    Output
    Synchronous
    TRST
    JTAG Reset (Optional)
    Input
    Asynchronous
    ZZ
    Sleep Mode
    Input
    Synchronous
    I/O
    0
    -I/O
    31
    , I/O
    P1
    -I/O
    P4
    Data Input / Output
    I/O
    Synchronous
    V
    DD
    , V
    DDQ
    Core Power I/O Power
    Supply
    Static
    V
    SS
    Ground
    Supply
    Static
    IDT71V2556S
    IDT71V2558S
    IDT71V2556SA
    IDT71V2558SA
    128K x 36, 256K x 18
    3.3V Synchronous ZBT SRAMs
    2.5V I/O, Burst Counter
    Pipelined Outputs
    cycle, and two cycles later the associated data cycle occurs, be it read
    or write.
    The IDT71V2556/58 contain data I/O, address and control signal
    registers. Output enable is the only asynchronous signal and can be used
    to disable the outputs at any given time.
    A Clock Enable (
    CEN
    ) pin allows operation of the IDT71V2556/58 to
    be suspended as long as necessary. All synchronous inputs are ignored
    when (
    CEN
    ) is high and the internal device registers will hold their previous
    values.
    There are three chip enable pins (
    CE
    1
    , CE
    2
    ,
    CE
    2
    ) that allow the user
    to deselect the device when desired. If any one of these three are not
    asserted when ADV/
    LD
    is low, no new memory operation can be initiated.
    However, any pending data transfers (reads or writes) will be completed.
    The data bus will tri-state two cycles after chip is deselected or a write is
    initiated.
    The IDT71V2556/58 has an on-chip burst counter. In the burst mode,
    the IDT71V2556/58 can provide four cycles of data for a single address
    presented to the SRAM The order of the burst sequence is defined by the
    LBO
    input pin. The
    LBO
    pin selects between linear and interleaved burst
    sequence. The ADV/
    LD
    signal is used to load a new external address
    (ADV/
    LD
    = LOW) or increment the internal burst counter (ADV/
    LD
    =
    HIGH).
    The IDT71V2556/58 SRAMs utilize IDT's latest high-performance
    CMOS process and are packaged in a JEDEC standard 14mmx 20mm
    100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
    (BGA) and a 165 fine pitch ball grid array (fBGA).
    相關(guān)PDF資料
    PDF描述
    IDT71V2556S166PF 128K x 36, 256K x 18 3.3V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
    IDT71V2556S166PFI 128K x 36, 256K x 18 3.3V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
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    IDT71V2556S200BQ 128K x 36, 256K x 18 3.3V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
    IDT71V2556S200BQI 128K x 36, 256K x 18 3.3V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs
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