參數(shù)資料
型號: IDT70T3539MS133BCI
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: DRAM
英文描述: HIGH-SPEED 2.5V 512K x 36 SYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V OR 2.5V INTERFACE
中文描述: 512K X 36 DUAL-PORT SRAM, 15 ns, PBGA256
封裝: BGA-256
文件頁數(shù): 22/26頁
文件大?。?/td> 421K
代理商: IDT70T3539MS133BCI
6.42
IDT70T3539M Preliminary
High-Speed 2.5V 512K x 36 Dual-Port Synchronous Static RAM Industrial and Commercial Temperature Ranges
Depth and Width Expansion
The IDT70T3539M features dual chip enables (refer to Truth
Table I) in order to facilitate rapid and simple depth expansion with no
requirements for external logic. Figure 4 illustrates how to control the
various chip enables in order to expand two devices in depth.
5678 drw 22
IDT70T3539M
CE
0
CE
1
CE
1
CE
0
CE
0
CE
1
A
19
CE
1
CE
0
V
DD
V
DD
IDT70T3539M
IDT70T3539M
IDT70T3539M
Control Inputs
Control Inputs
Control Inputs
Control Inputs
BE
,
R/
W
,
OE
,
CLK,
ADS
,
REPEAT
,
CNTEN
Figure 4. Depth and Width Expansion with IDT70T3539M
The IDT70T3539M can also be used in applications requiring
expanded width, as indicated in Figure 4. Through combining the control
signals, the devices can be grouped as necessary to accommodate
applications needing 72-bits or wider.
Register Sizes, and System Interface Parameter tables. Specifically,
commands for Array B must precede those for Array A in any JTAG
operations sent to the IDT70T3539M. Please reference Application Note
AN-411, "JTAG Testing of Multichip Modules" for specific instructions on
performing JTAG testing on the IDT70T3539M. AN-411 is available at
www.idt.com.
Array A
Array B
TCK
TMS
TRST
TDI
TDOA
TDIB
TDO
5678drw 23
IDT70T3539M
Figure 5. JTAG Configuration for IDT70T3539M
JTAG Functionality and Configuration
The IDT70T3539M is composed of two independent memory arrays,
and thus cannot be treated as a single JTAG device in the scan chain.
The two arrays (A and B) each have identical characteristics and
commands but must be treated as separate entities in JTAG operations.
Please refer to Figure 5.
JTAG signaling must be provided serially to each array and utilize the
information provided in the Identification Register Definitions, Scan
.
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