參數(shù)資料
型號(hào): IDT7006S35JB
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: DRAM
英文描述: HIGH-SPEED 16K x 8 DUAL-PORT STATIC RAM
中文描述: 16K X 8 DUAL-PORT SRAM, 35 ns, PQCC68
封裝: 0.950 X 0.950 INCH, 0.170 INCH HEIGHT, PLASTIC, LCC-68
文件頁(yè)數(shù): 10/20頁(yè)
文件大小: 263K
代理商: IDT7006S35JB
6.07
10
IDT7006S/L
HIGH-SPEED 16K x 8 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TIMING WAVEFORM OF WRITE CYCLE NO. 1, R/
W
CONTROLLED TIMING
(1,5,8)
TIMING WAVEFORM OF WRITE CYCLE NO. 2,
CE
CONTROLLED TIMING
(1,5)
NOTES:
1. R/
W
or
CE
must be High during all address transitions.
2. A write occurs during the overlap (t
EW
or t
WP
) of a Low
CE
and a Low R/
W
for memory array writing cycle.
3. t
WR
is measured from the earlier of
CE
or R/
W
(or
SEM
or R/
W
) going High to the end of write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the
CE
or
SEM
Low transition occurs simultaneously with or after the R/
W
Low transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last,
CE
or R/
W
.
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured by +/- 500mV from steady state with the
Output Test Load (Figure 2)
8. If
OE
is Low during R/
W
controlled write cycle, the write pulse width must be the larger of t
WP
or (t
WZ
+ t
DW
) to allow the I/O drivers to turn off and data
to be placed on the bus for the required t
DW
. If
OE
is High during an R/
W
controlled write cycle, this requirement does not apply and the write pulse can
be as short as the specified t
WP
.
9. To access RAM,
CE
= V
IL and
SEM
= V
IH.
To access semaphore
CE
= V
IH
and
SEM
= V
IL.
t
EW
must be met for either condition.
2739 drw 10
t
WC
t
AS
t
WR
t
DW
t
DH
ADDRESS
DATA
IN
R/
W
t
AW
t
EW
(3)
(2)
(6)
(9)
CE
or
SEM
R/
W
t
WC
t
HZ
t
AW
t
WR
t
AS
t
WP
DATA
OUT
(2)
t
WZ
t
DW
t
DH
t
OW
ADDRESS
DATA
IN
CE
or
SEM
(6)
(4)
(4)
(3)
2739 drw 09
(7)
(7)
(9)
OE
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