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參數(shù)資料
| 型號： | IDT54FCT16244CTEB |
| 廠商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分類： | 通用總線功能 |
| 英文描述： | FAST CMOS 16-BIT BUFFER/LINE DRIVER |
| 中文描述： | FCT SERIES, QUAD 4-BIT DRIVER, TRUE OUTPUT, CDFP48 |
| 封裝： | CERPACK-48 |
| 文件頁數(shù)： | 3/9頁 |
| 文件大小： | 151K |
| 代理商： | IDT54FCT16244CTEB |
5.2
3
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
NOTE:
1. This parameter is measured at characterization but not tested.
CAPACITANCE (TA = +25
°C, f = 1.0MHz)
FUNCTION TABLE
(1)
2544 lnk 04
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
2544 tbl 02
Symbol
Parameter(1)
Conditions
Typ.
Max.
Unit
CIN
Input
Capacitance
VIN = 0V
3.5
6.0
pF
COUT
Output
Capacitance
VOUT = 0V
3.5
8.0
pF
ABSOLUTE MAXIMUM RATINGS
(1)
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (STANDARD PARTS)
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = –40
°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC= 5.0V ± 10%
Inputs
Outputs
x
OE
xAx
xYx
LL
L
LH
H
HX
Z
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
0.8
V
II H
Input HIGH Current (Input pins)(5)
VCC = Max.
VI = VCC
—
±1
A
Input HIGH Current (I/O pins)(5)
—
±1
II L
Input LOW Current (Input pins)(5)
VI = GND
—
±1
Input LOW Current (I/O pins)(5)
—
±1
IOZH
High Impedance Output Current
VCC = Max.
VO = 2.7V
—
±1
A
IOZL
(3-State Output pins)(5)
VO = 0.5V
—
±1
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
—
–
0.7
–
1.2
V
IOS
Short Circuit Current
VCC = Max., VO = GND(3)
–80
–
140
–
225
mA
VH
Input Hysteresis
—
100
—
mV
ICCL
ICCH
ICCZ
Quiescent Power Supply Current
VCC = Max., VIN = GND or VCC
—
5
500
A
2544 lnk 05
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25
°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is
± 5A at TA = –55°C.
Symbol
Description
Max.
Unit
VTERM(2) Terminal Voltage with Respect to
GND
–0.5 to +7.0
V
VTERM(3) Terminal Voltage with Respect to
GND
–0.5 to
VCC +0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. All device terminals except FCT162XXXT and FCT166XXXT output and
I/O terminals.
3. Output and I/O terminals for FCT162XXXT and FCT166XXXT.
2544 lnk 03
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