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| 型號(hào)： | ICM7555 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | General purpose CMOS timer |
| 中文描述： | 低功耗、通用定時(shí)器 |
| 文件頁(yè)數(shù)： | 3/9頁(yè) |
| 文件大?。?/td> | 105K |
| 代理商： | ICM7555 |
Philips Semiconductors Linear Products
Product specification
ICM7555
General purpose CMOS timer
August 31, 1994
339
DC AND AC ELECTRICAL CHARACTERISTICS
T
A
= 25
°
C unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
ICM7555
TYP
UNITS
MIN
3
MAX
16
V
DD
Supply voltage
T
MIN
< T
A
< T
MAX
V
I
DD
Supply current
1
V
DD
= V
MIN
V
DD
= V
MAX
50
180
200
300
μ
A
μ
A
Astable mode timing
2
Initial accuracy
Drift with supply voltage
Drift with temperature
3
R
A
, R
B
= 1k to 100k, C = 0.1
μ
F
5
V <V
DD
<15V
V
DD
= 5V
V
DD
= 10V
V
DD
= 15V
1.0
0.1
50
75
100
0.65
0.31
50
10
1
50
10
1
100
20
2
0.7
0.65
0.1
0.2
15.7
4.5
0.2
5.0
3.0
%
%/V
ppm/
o
C
ppm/
o
C
ppm/
o
C
xV
DD
xV
DD
pA
pA
pA
pA
pA
pA
pA
pA
pA
V
xV
DD
V
V
V
DD
V
DD
V
V
TH
V
TRIG
Threshold voltage
Trigger voltage
V
DD
= 5V
V
DD
= 5V
0.63
0.29
0.67
0.34
I
TRIG
Trigger current
V
DD
= V
TRIG
= V
V
DD
= V
TRIG
= 5V
V
DD
= V
TRIG
= V
MIN
V
DD
= V
TH
= V
V
DD
= V
TH
= 5V
V
DD
= V
TH
= V
MIN
V
DD
= V
RST
= V
V
DD
= V
RST
= 5V
V
DD
= V
RST
= V
MIN
V
DD
= V
MIN
and V
MAX
V
DD
= 5V
V
DD
= V
, I
SINK
= 3.2mA
V
DD
= 5V, I
SINK
= 3.2mA
V
DD
= V
MAX
, I
SOURCE
= -1.0mA
V
DD
= 5V, I
SOURCE
= -1.0mA
V
DD
= 5V, I
DIS
= 10.0mA
R
L
= 10M
, C
L
= 10pF, V
DD
=
5V
R
L
= 10M
, C
L
= 10pF, V
DD
=
5V
I
TH
Threshold current
I
RST
Reset current
V
RST
V
CV
Reset voltage
Control voltage
0.4
0.62
1.0
0.67
0.4
0.4
V
OL
Output voltage (low)
V
OH
Output voltage (high)
15.25
4.0
V
DIS
Discharge output voltage
0.4
t
R
Rise time of output
3
45
75
ns
t
F
Fall time of output
3
Maximum oscillator frequency
(astable mode)
20
75
ns
F
MAX
500
kHz
NOTES:
1. The supply current value is essentially independent of the TRIGGER, THRESHOLD, and RESET voltages.
2. Astable timing is calculated using the following equation: f =
1.38
(R
A
+ 2R
B
)C
. The components are defined in Figure 2.
3. Parameter is not 100% tested.
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